Hung-Chin Chung

Person

Pingzhen, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device with profiled work-function metal gate electro...
- Patent number 12,176,251
- Issue date Dec 24, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Da-Yuan Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pre-deposition treatment for FET technology and devices formed thereby
- Patent number 12,142,531
- Issue date Nov 12, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Yen Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacture
- Patent number 12,142,530
- Issue date Nov 12, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of tuning threshold voltages of transistors
- Patent number 12,087,767
- Issue date Sep 10, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kuan-Chang Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacture
- Patent number 12,087,637
- Issue date Sep 10, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simultaneous multi-bandwidth optical inspection of semiconductor de...
- Patent number 12,068,207
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shih-Chang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field-effect transistor device having hybrid work function laye...
- Patent number 12,051,753
- Issue date Jul 30, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chun-Neng Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacture
- Patent number 12,040,235
- Issue date Jul 16, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Ching Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field-effect transistor device having hybrid work function laye...
- Patent number 12,021,145
- Issue date Jun 25, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chun-Neng Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate resistance reduction through low-resistivity conductive layer
- Patent number 11,916,146
- Issue date Feb 27, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hot spot defect detecting method and hot spot defect detecting system
- Patent number 11,900,586
- Issue date Feb 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device with profiled work-function metal gate electro...
- Patent number 11,804,409
- Issue date Oct 31, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Da-Yuan Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method
- Patent number 11,735,481
- Issue date Aug 22, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shao-Jyun Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of tuning threshold voltages of transistors
- Patent number 11,538,805
- Issue date Dec 27, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Kuan-Chang Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacture
- Patent number 11,437,280
- Issue date Sep 6, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Ching Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device having a doped work-...
- Patent number 11,387,344
- Issue date Jul 12, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Ching Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field-effect transistor device having hybrid work function laye...
- Patent number 11,380,793
- Issue date Jul 5, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chun-Neng Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pre-deposition treatment for FET technology and devices formed thereby
- Patent number 11,322,411
- Issue date May 3, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Yen Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate resistance reduction through low-resistivity conductive layer
- Patent number 11,302,818
- Issue date Apr 12, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pre-deposition treatment for FET technology and devices formed thereby
- Patent number 11,302,582
- Issue date Apr 12, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Yen Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for semiconductor wafer inspection and system thereof
- Patent number 11,231,376
- Issue date Jan 25, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and method
- Patent number 11,081,396
- Issue date Aug 3, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shao-Jyun Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with profiled work-function metal gate electro...
- Patent number 11,075,124
- Issue date Jul 27, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Da-Yuan Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor metal gate and method of manufacture
- Patent number 11,056,395
- Issue date Jul 6, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal gate structure with multi-layer composition
- Patent number 10,998,414
- Issue date May 4, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hung-Chin Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hot spot defect detecting method and hot spot defect detecting system
- Patent number 10,872,406
- Issue date Dec 22, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and method of manufacture
- Patent number 10,867,864
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection method and defect inspection system
- Patent number 10,809,635
- Issue date Oct 20, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device with profiled work-function metal gate electro...
- Patent number 10,699,966
- Issue date Jun 30, 2020
- Taiwan Semiconductor Manufacturing Company Limited
- Da-Yuan Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pre-deposition treatment for FET technology and devices formed thereby
- Patent number 10,504,789
- Issue date Dec 10, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Yen Tsai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE
- Publication number 20240387276
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURE
- Publication number 20240387679
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Ching Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE
- Publication number 20240363424
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIMULTANEOUS MULTI-BANDWIDTH OPTICAL INSPECTION OF SEMICONDUCTOR DE...
- Publication number 20240363451
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih-Chang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF TUNING THRESHOLD VOLTAGES OF TRANSISTORS
- Publication number 20240363627
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kuan-Chang Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIN FIELD-EFFECT TRANSISTOR DEVICE HAVING HYBRID WORK FUNCTION LAYE...
- Publication number 20240313114
- Publication date Sep 19, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Neng Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE RESISTANCE REDUCTION THROUGH LOW-RESISTIVITY CONDUCTIVE LAYER
- Publication number 20240162349
- Publication date May 16, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOT SPOT DEFECT DETECTING METHOD AND HOT SPOT DEFECT DETECTING SYSTEM
- Publication number 20240144467
- Publication date May 2, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FIN FIELD-EFFECT TRANSISTOR DEVICE HAVING HYBRID WORK FUNCTION LAYE...
- Publication number 20240021729
- Publication date Jan 18, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Neng Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIMULTANEOUS MULTI-BANDWIDTH OPTICAL INSPECTION OF SEMICONDUCTOR DE...
- Publication number 20230411223
- Publication date Dec 21, 2023
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Shih-Chang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH PROFILED WORK-FUNCTION METAL GATE ELECTRO...
- Publication number 20230369132
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Da-Yuan Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method
- Publication number 20230343648
- Publication date Oct 26, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shao-Jyun Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Tuning Threshold Voltages of Transistors
- Publication number 20230122022
- Publication date Apr 20, 2023
- Taiwan Semiconductor Manufactoring Co., Ltd.
- Kuan-Chang Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method of Manufacture
- Publication number 20220359296
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Ching Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Devices and Methods of Manufacture
- Publication number 20220336619
- Publication date Oct 20, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Ching Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIN FIELD-EFFECT TRANSISTOR DEVICE HAVING HYBRID WORK FUNCTION LAYE...
- Publication number 20220328683
- Publication date Oct 13, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Neng Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pre-Deposition Treatment for FET Technology and Devices Formed Thereby
- Publication number 20220262685
- Publication date Aug 18, 2022
- TAIWAN SEMICONDUCTOR MANUFACTURING CO. LTD.
- Cheng-Yen Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gate Resistance Reduction Through Low-Resistivity Conductive Layer
- Publication number 20220238715
- Publication date Jul 28, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Tuning Threshold Voltages of Transistors
- Publication number 20210407995
- Publication date Dec 30, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kuan-Chang Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE
- Publication number 20210391219
- Publication date Dec 16, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Ching Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method
- Publication number 20210358811
- Publication date Nov 18, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shao-Jyun Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH PROFILED WORK-FUNCTION METAL GATE ELECTRO...
- Publication number 20210351085
- Publication date Nov 11, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Da-Yuan Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE
- Publication number 20210327761
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Devices and Methods of Manufacture
- Publication number 20210273070
- Publication date Sep 2, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Ching Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOT SPOT DEFECT DETECTING METHOD AND HOT SPOT DEFECT DETECTING SYSTEM
- Publication number 20210118125
- Publication date Apr 22, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Device and Method of Manufacture
- Publication number 20210098301
- Publication date Apr 1, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method
- Publication number 20210082768
- Publication date Mar 18, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shao-Jyun Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gate Resistance Reduction Through Low-Resistivity Conductive Layer
- Publication number 20210083118
- Publication date Mar 18, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SEMICONDUCTOR WAFER INSPECTION AND SYSTEM THEREOF
- Publication number 20210063319
- Publication date Mar 4, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- CHIEN-HUEI CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE
- Publication number 20210057280
- Publication date Feb 25, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS

Hung-Chin Chung

Person

Patents Grantslast 30 patents

Semiconductor device with profiled work-function metal gate electro...

Pre-deposition treatment for FET technology and devices formed thereby

Semiconductor device and method of manufacture

Method of tuning threshold voltages of transistors

Semiconductor device and method of manufacture

Simultaneous multi-bandwidth optical inspection of semiconductor de...

Fin field-effect transistor device having hybrid work function laye...

Semiconductor device and method of manufacture

Fin field-effect transistor device having hybrid work function laye...

Gate resistance reduction through low-resistivity conductive layer

Hot spot defect detecting method and hot spot defect detecting system

Semiconductor device with profiled work-function metal gate electro...

Semiconductor device and method

Method of tuning threshold voltages of transistors

Semiconductor device and method of manufacture

Method of manufacturing a semiconductor device having a doped work-...

Fin field-effect transistor device having hybrid work function laye...

Pre-deposition treatment for FET technology and devices formed thereby

Gate resistance reduction through low-resistivity conductive layer

Pre-deposition treatment for FET technology and devices formed thereby

Method for semiconductor wafer inspection and system thereof

Semiconductor device and method

Semiconductor device with profiled work-function metal gate electro...

Transistor metal gate and method of manufacture

Metal gate structure with multi-layer composition

Hot spot defect detecting method and hot spot defect detecting system

Semiconductor device and method of manufacture

Defect inspection method and defect inspection system

Semiconductor device with profiled work-function metal gate electro...

Pre-deposition treatment for FET technology and devices formed thereby

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE

SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURE

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE

SIMULTANEOUS MULTI-BANDWIDTH OPTICAL INSPECTION OF SEMICONDUCTOR DE...

METHOD OF TUNING THRESHOLD VOLTAGES OF TRANSISTORS

FIN FIELD-EFFECT TRANSISTOR DEVICE HAVING HYBRID WORK FUNCTION LAYE...

GATE RESISTANCE REDUCTION THROUGH LOW-RESISTIVITY CONDUCTIVE LAYER

HOT SPOT DEFECT DETECTING METHOD AND HOT SPOT DEFECT DETECTING SYSTEM

FIN FIELD-EFFECT TRANSISTOR DEVICE HAVING HYBRID WORK FUNCTION LAYE...

SIMULTANEOUS MULTI-BANDWIDTH OPTICAL INSPECTION OF SEMICONDUCTOR DE...

SEMICONDUCTOR DEVICE WITH PROFILED WORK-FUNCTION METAL GATE ELECTRO...

Semiconductor Device and Method

Method of Tuning Threshold Voltages of Transistors

Semiconductor Device and Method of Manufacture

Semiconductor Devices and Methods of Manufacture

FIN FIELD-EFFECT TRANSISTOR DEVICE HAVING HYBRID WORK FUNCTION LAYE...

Pre-Deposition Treatment for FET Technology and Devices Formed Thereby

Gate Resistance Reduction Through Low-Resistivity Conductive Layer

Method of Tuning Threshold Voltages of Transistors

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE

Semiconductor Device and Method

SEMICONDUCTOR DEVICE WITH PROFILED WORK-FUNCTION METAL GATE ELECTRO...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE

Semiconductor Devices and Methods of Manufacture

HOT SPOT DEFECT DETECTING METHOD AND HOT SPOT DEFECT DETECTING SYSTEM

Semiconductor Device and Method of Manufacture

Semiconductor Device and Method

Gate Resistance Reduction Through Low-Resistivity Conductive Layer

METHOD FOR SEMICONDUCTOR WAFER INSPECTION AND SYSTEM THEREOF

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE