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Hung Hing Anthony Pang
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San Jose, CA, US
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last 30 patents
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Patent Grant
Method and system for semiconductor device characterization pattern...
Patent number
7,571,412
Issue date
Aug 4, 2009
Altera Corporation
Hung Hing Anthony Pang
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Techniques for automatically generating tests for programmable circ...
Patent number
7,024,327
Issue date
Apr 4, 2006
Altera Corporation
Jayabrata Ghosh Dastidar
G01 - MEASURING TESTING