Hung-Jen Weng

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Pan-Chiao City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for wafer analysis
- Patent number 6,785,617
- Issue date Aug 31, 2004
- ProMos Technologies Inc.
- Hung-Jen Weng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining and assessing chamber inconsis...
- Patent number 6,757,640
- Issue date Jun 29, 2004
- ProMos Technologies Inc.
- Hung-Jen Weng
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for determining and assessing chamber inconsis...
- Patent number 6,537,834
- Issue date Mar 25, 2003
- ProMos Technologies, Inc.
- Hung-Jen Weng
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for determining and assessing chamber inconsis...
- Publication number 20030233745
- Publication date Dec 25, 2003
- Hung-Jen Weng
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING AND ASSESSING CHAMBER INCONSIS...
- Publication number 20030022398
- Publication date Jan 30, 2003
- Hung-Jen Weng
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for wafer analysis
- Publication number 20030014197
- Publication date Jan 16, 2003
- Hung-Jen Weng
- G01 - MEASURING TESTING