Hung Quoc Nguyen

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Carrollton, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
High-side gate over-voltage stress testing
- Patent number 11,624,769
- Issue date Apr 11, 2023
- Texas Instruments Incorporated
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Grant
High-side gate over-voltage stress testing
- Patent number 11,353,494
- Issue date Jun 7, 2022
- Texas Instruments Incorporated
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Grant
High-side gate over-voltage stress testing
- Patent number 10,613,134
- Issue date Apr 7, 2020
- Texas Instruments Incorporated
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING
- Publication number 20220260627
- Publication date Aug 18, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Application
HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING
- Publication number 20200182925
- Publication date Jun 11, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Application
HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING
- Publication number 20180180661
- Publication date Jun 28, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Application
SOCKET ADAPTER FOR TESTING SINGULATED ICS WITH WAFER LEVEL PROBE CARD
- Publication number 20100315112
- Publication date Dec 16, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Hung Quoc Nguyen
- G01 - MEASURING TESTING