Huo-Kang HSU

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CHU-PEI CITY, TW

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Patents Grantslast 30 patents

Information Patent Grant
Probe card and wafer testing assembly thereof
- Patent number 12,099,078
- Issue date Sep 24, 2024
- MPI Corporation
- Yi-Chien Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Positionable probe card and manufacturing method thereof
- Patent number 11,402,407
- Issue date Aug 2, 2022
- MPI CORPORATION
- Zhi-Wei Su
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for high frequency signal test and medium or low frequen...
- Patent number 11,150,269
- Issue date Oct 19, 2021
- MPI Corporation
- Hui-Pin Yang
- G01 - MEASURING TESTING
Information Patent Grant
Method for making support structure for probing device
- Patent number 9,643,271
- Issue date May 9, 2017
- MPI Corporation
- Kun-Han Hsieh
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of manufacturing space transformer for probe card
- Patent number 9,442,135
- Issue date Sep 13, 2016
- MPI Corporation
- Kuan-Chun Chou
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD AND WAFER TESTING ASSEMBLY THEREOF
- Publication number 20230065896
- Publication date Mar 2, 2023
- MPI Corporation
- Yi-Chien Tsai
- G01 - MEASURING TESTING
Information Patent Application
POSITIONABLE PROBE CARD AND MANUFACTURING METHOD THEREOF
- Publication number 20210181237
- Publication date Jun 17, 2021
- MPI Corporation
- Zhi-Wei SU
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR HIGH FREQUENCY SIGNAL TEST AND MEDIUM OR LOW FREQUEN...
- Publication number 20210048452
- Publication date Feb 18, 2021
- MPI Corporation
- Hui-Pin YANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MAKING SUPPORT STRUCTURE FOR PROBING DEVICE
- Publication number 20150206850
- Publication date Jul 23, 2015
- MPI Corporation
- Kun-Han HSIEH
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD OF MANUFACTURING SPACE TRANSFORMER FOR PROBE CARD
- Publication number 20140290053
- Publication date Oct 2, 2014
- MPI Corporation
- Kuan-Chun CHOU
- G01 - MEASURING TESTING