Hursh NAIK

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Sunnyvale, CA, US

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Patents Applicationslast 30 patents

Information Patent Application
METRICS FOR INSTANCE RANKING FOR CLASSIFICATION AND REGRESSION
- Publication number 20240152813
- Publication date May 9, 2024
- Synopsys, Inc.
- Xiang GAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STATISTICAL GRAPH CIRCUIT COMPONENT PROBABILITY MODEL FOR AN INTEGR...
- Publication number 20240037313
- Publication date Feb 1, 2024
- Synopsys, Inc.
- Xiang GAO
- G06 - COMPUTING CALCULATING COUNTING