Huy Khanh Tang

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Westford, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Microelectronic device testing apparatus and method
- Patent number 9,157,928
- Issue date Oct 13, 2015
- Analog Devices, Inc.
- Wei Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Microelectronic Device Testing Apparatus and Method
- Publication number 20130239692
- Publication date Sep 19, 2013
- Analog Devices, Inc.
- Wei Chen
- G01 - MEASURING TESTING