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Suwon-si, KR
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last 30 patents
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Patent Grant
Defect investigation device simultaneously detecting photoluminesce...
Patent number
11,009,461
Issue date
May 18, 2021
ETAMAX CO., LTD
Huyndon Jung
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...
Publication number
20230109887
Publication date
Apr 13, 2023
ETAMAX CO., LTD
Huyndon JUNG
G01 - MEASURING TESTING
Information
Patent Application
DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...
Publication number
20230113093
Publication date
Apr 13, 2023
ETAMAX CO., LTD
Huyndon JUNG
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
DEFECT INVESTIGATION DEVICE SIMULTANEOUSLY DETECTING PHOTOLUMINESCE...
Publication number
20190302025
Publication date
Oct 3, 2019
ETAMAX CO., LTD
Huyndon JUNG
G01 - MEASURING TESTING