Hwan J. JEONG

Person

Los Altos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System for making accurate grating patterns using multiple writing...
- Patent number 11,243,480
- Issue date Feb 8, 2022
- Applied Materials, Inc.
- David Markle
- G02 - OPTICS
Information Patent Grant
Resolution enhanced digital lithography with anti-blazed DMD
- Patent number 10,983,441
- Issue date Apr 20, 2021
- Applied Materials, Inc.
- Thomas L. Laidig
- G02 - OPTICS
Information Patent Grant
Piecewise alignment modeling method
- Patent number 10,495,983
- Issue date Dec 3, 2019
- Applied Materials, Inc.
- Tamer Coskun
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Empirical detection of lens aberration for diffraction-limited opti...
- Patent number 10,451,564
- Issue date Oct 22, 2019
- Applied Materials, Inc.
- Qin Zhong
- G01 - MEASURING TESTING
Information Patent Grant
Image improvement for alignment through incoherent illumination ble...
- Patent number 10,429,744
- Issue date Oct 1, 2019
- Applied Materials, Inc.
- Tamer Coskun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Resolution enhanced digital lithography with anti-blazed DMD
- Patent number 10,372,042
- Issue date Aug 6, 2019
- Applied Materials, Inc.
- Thomas L. Laidig
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Piecewise alignment modeling method
- Patent number 10,133,193
- Issue date Nov 20, 2018
- Applied Materials, Inc.
- Tamer Coskun
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and method of direct writing with photons beyond the diff...
- Patent number 9,304,410
- Issue date Apr 5, 2016
- Periodic Structures Inc.
- David A. Markle
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Phase-controlled model-based overlay measurement systems and methods
- Patent number 9,189,705
- Issue date Nov 17, 2015
- JSMSW Technology LLC
- Hwan J. Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for microscopy having resolution beyond the A...
- Patent number 9,075,013
- Issue date Jul 7, 2015
- Periodic Structures, Inc.
- David A. Markle
- G01 - MEASURING TESTING
Information Patent Grant
Optical imaging system with catoptric objective; broadband objectiv...
- Patent number 9,052,494
- Issue date Jun 9, 2015
- KLA-Tencor Technologies Corporation
- Shiow-Hwei Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Dark field diffraction based overlay
- Patent number 8,817,273
- Issue date Aug 26, 2014
- Nanometrics Incorporated
- Hwan J. Jeong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of direct writing with photons beyond the diffraction limit
- Patent number 8,642,232
- Issue date Feb 4, 2014
- Periodic Structures, Inc.
- David A. Markle
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
High-resolution, common-path interferometric imaging systems and me...
- Patent number 8,559,014
- Issue date Oct 15, 2013
- Hwan J. Jeong
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interferometric defect detection and classification
- Patent number 7,986,412
- Issue date Jul 26, 2011
- JZW LLC
- Hwan J. Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric defect detection
- Patent number 7,864,334
- Issue date Jan 4, 2011
- JZW LLC
- Hwan J. Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Serrated Fourier filters and inspection systems
- Patent number 7,397,557
- Issue date Jul 8, 2008
- KLA-Tencor Technologies Corp.
- Hwan J. Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Systems configured to provide illumination of a specimen during ins...
- Patent number 7,199,946
- Issue date Apr 3, 2007
- KLA-Tencor Technologies Corp.
- Hwan J. Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Optical interleaving with enhanced spectral response and reduced po...
- Patent number 6,907,167
- Issue date Jun 14, 2005
- Gazillion Bits, Inc.
- Hwan J. Jeong
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wavelength division multiplexing with narrow band reflective filters
- Patent number 6,751,373
- Issue date Jun 15, 2004
- Gazillion Bits, Inc.
- Hwan J. Jeong
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus having line source of radiant energy for exposing a subst...
- Patent number 6,531,681
- Issue date Mar 11, 2003
- Ultratech Stepper, Inc.
- David A. Markle
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Scanning microlithographic apparatus and method for projecting a la...
- Patent number 6,381,077
- Issue date Apr 30, 2002
- Ultratech Stepper, Inc.
- Hwan J. Jeong
- G02 - OPTICS
Information Patent Grant
Four-mirror extreme ultraviolet (EUV) lithography projection system
- Patent number 6,142,641
- Issue date Nov 7, 2000
- Ultratech Stepper, Inc.
- Simon J Cohen
- G02 - OPTICS
Information Patent Grant
Low-loss light redirection apparatus
- Patent number 5,852,693
- Issue date Dec 22, 1998
- Ultratech Stepper, Inc.
- Hwan J. Jeong
- G02 - OPTICS
Information Patent Grant
Point diffraction interferometer and pin mirror for use therewith
- Patent number 5,822,066
- Issue date Oct 13, 1998
- Ultratech Stepper, Inc.
- Hwan J. Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Pattern recognition alignment system
- Patent number 5,621,813
- Issue date Apr 15, 1997
- Ultratech Stepper, Inc.
- Robert L. Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Beamsplitter in single fold optical system and optical variable mag...
- Patent number 5,557,469
- Issue date Sep 17, 1996
- Ultratech Stepper, Inc.
- David A. Markle
- G02 - OPTICS
Information Patent Grant
Alignment system for a Half-Field Dyson projection system
- Patent number 5,402,205
- Issue date Mar 28, 1995
- Ultratech Stepper, Inc.
- David A. Markle
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System for achieving a parallel relationship between surfaces of wa...
- Patent number 5,329,332
- Issue date Jul 12, 1994
- Ultratech Stepper, Inc.
- David A. Markle
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Illumination system for Half-Field Dyson stepper
- Patent number 5,303,001
- Issue date Apr 12, 1994
- Ultratech Stepper, Inc.
- Hwan J. Jeong
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
A SYSTEM FOR MAKING ACCURATE GRATING PATTERNS USING MULTIPLE WRITIN...
- Publication number 20210191285
- Publication date Jun 24, 2021
- Applied Materials, Inc.
- David MARKLE
- G02 - OPTICS
Information Patent Application
RESOLUTION ENHANCED DIGITAL LITHOGRAPHY WITH ANTI-BLAZED DMD
- Publication number 20190361353
- Publication date Nov 28, 2019
- Applied Materials, Inc.
- Thomas L. LAIDIG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
EMPIRICAL DETECTION OF LENS ABERRATION FOR DIFFRACTION-LIMITED OPTI...
- Publication number 20190128825
- Publication date May 2, 2019
- Applied Materials, Inc.
- Qin ZHONG
- G02 - OPTICS
Information Patent Application
PIECEWISE ALIGNMENT MODELING METHOD
- Publication number 20190033729
- Publication date Jan 31, 2019
- Applied Materials, Inc.
- Tamer COSKUN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
IMAGE IMPROVEMENT FOR ALIGNMENT THROUGH INCOHERENT ILLUMINATION BLE...
- Publication number 20180373161
- Publication date Dec 27, 2018
- Applied Materials, Inc.
- Tamer Coskun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RESOLUTION ENHANCED DIGITAL LITHOGRAPHY WITH ANTI-BLAZED DMD
- Publication number 20180210346
- Publication date Jul 26, 2018
- Applied Materials, Inc.
- Thomas L. LAIDIG
- G02 - OPTICS
Information Patent Application
PIECEWISE ALIGNMENT MODELING METHOD
- Publication number 20180024444
- Publication date Jan 25, 2018
- Applied Materials, Inc.
- Tamer COSKUN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus and method of direct writing with photons beyond the diff...
- Publication number 20150331330
- Publication date Nov 19, 2015
- Periodic Structures, Inc.
- David A. Markle
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Phase-controlled model-based overlay measurement systems and methods
- Publication number 20150043803
- Publication date Feb 12, 2015
- JSMSW Technology LLC
- Hwan J. Jeong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and methods for microscopy having resolution beyond the A...
- Publication number 20130286179
- Publication date Oct 31, 2013
- Periodic Structures, Inc.
- David A. Markle
- G01 - MEASURING TESTING
Information Patent Application
DARK FIELD DIFFRACTION BASED OVERLAY
- Publication number 20130278942
- Publication date Oct 24, 2013
- Nanometrics Incorporated
- Hwan J. Jeong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICAL IMAGING SYSTEM WITH CATOPTRIC OBJECTIVE; BROADBAND OBJECTIV...
- Publication number 20130155399
- Publication date Jun 20, 2013
- KLA-Tencor Corporation
- Shiow-Hwei Hwang
- G02 - OPTICS
Information Patent Application
Systems for and methods of illumination at a high optical solid angle
- Publication number 20110280038
- Publication date Nov 17, 2011
- Hwan J. JEONG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL IMAGING SYSTEM WITH CATOPTRIC OBJECTIVE; BROADBAND OBJECTIV...
- Publication number 20110242528
- Publication date Oct 6, 2011
- KLA-Tencor Corporation
- Shiow-Hwei Hwang
- G02 - OPTICS
Information Patent Application
High-resolution, common-path interferometric imaging systems and me...
- Publication number 20110075928
- Publication date Mar 31, 2011
- Hwan J. Jeong
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
INTERFEROMETRIC DEFECT DETECTION AND CLASSIFICATION
- Publication number 20110075151
- Publication date Mar 31, 2011
- JZW LLC
- Hwan J. JEONG
- G01 - MEASURING TESTING
Information Patent Application
Interferometric Defect Detection
- Publication number 20090296096
- Publication date Dec 3, 2009
- Hwan J. JEONG
- G01 - MEASURING TESTING
Information Patent Application
Systems configured to provide illumination of a specimen during ins...
- Publication number 20060274432
- Publication date Dec 7, 2006
- Hwan J. Jeong
- G02 - OPTICS
Information Patent Application
Serrated fourier filters and inspection systems
- Publication number 20060274305
- Publication date Dec 7, 2006
- Hwan J. Jeong
- G01 - MEASURING TESTING
Information Patent Application
Wavelength division multiplexing with narrow band reflective filters
- Publication number 20020181046
- Publication date Dec 5, 2002
- Gazillion Bits, Inc.
- Hwan J. Jeong
- G02 - OPTICS
Information Patent Application
Optical interleaving with enhanced spectral response and reduced po...
- Publication number 20020126354
- Publication date Sep 12, 2002
- Gazillion Bits, Inc.
- Hwan J. Jeong
- G02 - OPTICS

Hwan J. JEONG

Person

Patents Grantslast 30 patents

System for making accurate grating patterns using multiple writing...

Resolution enhanced digital lithography with anti-blazed DMD

Piecewise alignment modeling method

Empirical detection of lens aberration for diffraction-limited opti...

Image improvement for alignment through incoherent illumination ble...

Resolution enhanced digital lithography with anti-blazed DMD

Piecewise alignment modeling method

Apparatus and method of direct writing with photons beyond the diff...

Phase-controlled model-based overlay measurement systems and methods

Apparatus and methods for microscopy having resolution beyond the A...

Optical imaging system with catoptric objective; broadband objectiv...

Dark field diffraction based overlay

Method of direct writing with photons beyond the diffraction limit

High-resolution, common-path interferometric imaging systems and me...

Interferometric defect detection and classification

Interferometric defect detection

Serrated Fourier filters and inspection systems

Systems configured to provide illumination of a specimen during ins...

Optical interleaving with enhanced spectral response and reduced po...

Wavelength division multiplexing with narrow band reflective filters

Apparatus having line source of radiant energy for exposing a subst...

Scanning microlithographic apparatus and method for projecting a la...

Four-mirror extreme ultraviolet (EUV) lithography projection system

Low-loss light redirection apparatus

Point diffraction interferometer and pin mirror for use therewith

Pattern recognition alignment system

Beamsplitter in single fold optical system and optical variable mag...

Alignment system for a Half-Field Dyson projection system

System for achieving a parallel relationship between surfaces of wa...

Illumination system for Half-Field Dyson stepper

Patents Applicationslast 30 patents

A SYSTEM FOR MAKING ACCURATE GRATING PATTERNS USING MULTIPLE WRITIN...

RESOLUTION ENHANCED DIGITAL LITHOGRAPHY WITH ANTI-BLAZED DMD

EMPIRICAL DETECTION OF LENS ABERRATION FOR DIFFRACTION-LIMITED OPTI...

PIECEWISE ALIGNMENT MODELING METHOD

IMAGE IMPROVEMENT FOR ALIGNMENT THROUGH INCOHERENT ILLUMINATION BLE...

RESOLUTION ENHANCED DIGITAL LITHOGRAPHY WITH ANTI-BLAZED DMD

PIECEWISE ALIGNMENT MODELING METHOD

Apparatus and method of direct writing with photons beyond the diff...

Phase-controlled model-based overlay measurement systems and methods

Apparatus and methods for microscopy having resolution beyond the A...

DARK FIELD DIFFRACTION BASED OVERLAY

OPTICAL IMAGING SYSTEM WITH CATOPTRIC OBJECTIVE; BROADBAND OBJECTIV...

Systems for and methods of illumination at a high optical solid angle

OPTICAL IMAGING SYSTEM WITH CATOPTRIC OBJECTIVE; BROADBAND OBJECTIV...

High-resolution, common-path interferometric imaging systems and me...

INTERFEROMETRIC DEFECT DETECTION AND CLASSIFICATION

Interferometric Defect Detection

Systems configured to provide illumination of a specimen during ins...

Serrated fourier filters and inspection systems

Wavelength division multiplexing with narrow band reflective filters

Optical interleaving with enhanced spectral response and reduced po...