HWASUNG RHEE

Person

Gyeonggi-do, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device including via and wiring
- Patent number 11,637,065
- Issue date Apr 25, 2023
- Samsung Electronics Co., Ltd.
- Miji Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including via and wiring
- Patent number 11,239,162
- Issue date Feb 1, 2022
- Samsung Electronics Co., Ltd.
- Miji Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with fin field effect transistors
- Patent number 10,847,514
- Issue date Nov 24, 2020
- Samsung Electronics Co., Ltd.
- Je-Min Yoo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with fin field effect transistors having diffe...
- Patent number 10,128,243
- Issue date Nov 13, 2018
- Samsung Electronics Co., Ltd.
- Je-Min Yoo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having test structure
- Patent number 9,337,112
- Issue date May 10, 2016
- Samsung Electronics Co., Ltd.
- Ping Hsun Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having test structure
- Patent number 9,082,739
- Issue date Jul 14, 2015
- Samsung Electronics Co., Ltd.
- Ping Hsun Su
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICES HAVING A SEAL RING
- Publication number 20240413245
- Publication date Dec 12, 2024
- Samsung Electronics Co., Ltd.
- In Namgung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING VIA AND WIRING
- Publication number 20220148965
- Publication date May 12, 2022
- Samsung Electronics Co., Ltd.
- MIJI LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING VIA AND WIRING
- Publication number 20210043556
- Publication date Feb 11, 2021
- Samsung Electronics Co., Ltd.
- MIJI LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING A SEMICONDUCTOR DEVICE
- Publication number 20200395463
- Publication date Dec 17, 2020
- Samsung Electronics Co., Ltd.
- Byungjae PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20190385915
- Publication date Dec 19, 2019
- Samsung Electronics Co., Ltd.
- Youngmin PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH FIN FIELD EFFECT TRANSISTORS
- Publication number 20190067287
- Publication date Feb 28, 2019
- Samsung Electronics Co., Ltd.
- Je-Min YOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH FIN FIELD EFFECT TRANSISTORS
- Publication number 20160155741
- Publication date Jun 2, 2016
- Je-Min YOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING TEST STRUCTURE
- Publication number 20160020159
- Publication date Jan 21, 2016
- Samsung Electronics Co., Ltd.
- PING HSUN SU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING TEST STRUCTURE
- Publication number 20140339559
- Publication date Nov 20, 2014
- Samsung Electronics Co., Ltd.
- PING HSUN SU
- H01 - BASIC ELECTRIC ELEMENTS

HWASUNG RHEE

Person

Patents Grantslast 30 patents

Semiconductor device including via and wiring

Semiconductor device including via and wiring

Semiconductor device with fin field effect transistors

Semiconductor device with fin field effect transistors having diffe...

Semiconductor device having test structure

Semiconductor device having test structure

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICES HAVING A SEAL RING

SEMICONDUCTOR DEVICE INCLUDING VIA AND WIRING

SEMICONDUCTOR DEVICE INCLUDING VIA AND WIRING

METHOD OF FABRICATING A SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE WITH FIN FIELD EFFECT TRANSISTORS

SEMICONDUCTOR DEVICE WITH FIN FIELD EFFECT TRANSISTORS

SEMICONDUCTOR DEVICE HAVING TEST STRUCTURE

SEMICONDUCTOR DEVICE HAVING TEST STRUCTURE