Hyejin KIM

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and method of adjusting focus of electron micro...
- Patent number 11,670,479
- Issue date Jun 6, 2023
- HITACHI HIGH-TECH CORPORATION
- Takeyoshi Ohashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope and method for measuring pattern
- Patent number 11,276,554
- Issue date Mar 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Takeyoshi Ohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning microscope with controlled variable measurement parameters
- Patent number 10,338,367
- Issue date Jul 2, 2019
- Hitachi, Ltd.
- Ryoko Araki
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON MICROSCOPE AND METHOD OF ADJUSTING FOCUS OF ELECTRON MICRO...
- Publication number 20210384006
- Publication date Dec 9, 2021
- HITACHI HIGH-TECH CORPORATION
- Takeyoshi Ohashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND METHOD FOR MEASURING PATTERN
- Publication number 20210043420
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Takeyoshi Ohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING MICROSCOPE
- Publication number 20180067294
- Publication date Mar 8, 2018
- Hitachi, Ltd
- Ryoko ARAKI
- G02 - OPTICS