Hyeongeu Kim

Person

Phoenix, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reactor system and method to reduce residue buildup during a film d...
- Patent number 12,043,899
- Issue date Jul 23, 2024
- ASM IP Holding B.V.
- Hyeongeu Kim
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System and method for thermally calibrating semiconductor process c...
- Patent number 11,747,209
- Issue date Sep 5, 2023
- ASM IP Holding, B.V.
- Yen Lin Leow
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Reactor system and method to reduce residue buildup during a film d...
- Patent number 11,390,950
- Issue date Jul 19, 2022
- ASM IP Holding B.V.
- Hyeongeu Kim
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods for thermally calibrating reaction chambers
- Patent number 10,943,771
- Issue date Mar 9, 2021
- ASM IP Holding B.V.
- Hyeongeu Kim
- G01 - MEASURING TESTING
Information Patent Grant
System and method for thermally calibrating semiconductor process c...
- Patent number 10,732,046
- Issue date Aug 4, 2020
- ASM IP Holding B.V.
- Yen Lin Leow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for thermally calibrating reaction chambers
- Patent number 10,643,826
- Issue date May 5, 2020
- ASM IP Holdings B.V.
- Hyeongeu Kim
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
REACTOR SYSTEM AND METHOD TO REDUCE RESIDUE BUILDUP DURING A FILM D...
- Publication number 20220307139
- Publication date Sep 29, 2022
- ASM IP HOLDING B.V.
- Hyeongeu Kim
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEM AND METHOD FOR THERMALLY CALIBRATING SEMICONDUCTOR PROCESS C...
- Publication number 20200333189
- Publication date Oct 22, 2020
- ASM IP HOLDING B.V.
- Yen Lin Leow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR THERMALLY CALIBRATING REACTION CHAMBERS
- Publication number 20200227243
- Publication date Jul 16, 2020
- ASM IP HOLDING B.V.
- Hyeongeu Kim
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEM AND METHOD FOR THERMALLY CALIBRATING SEMICONDUCTOR PROCESS C...
- Publication number 20200080894
- Publication date Mar 12, 2020
- ASM IP HOLDING B.V.
- Yen Lin Leow
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
REACTOR SYSTEM AND METHOD TO REDUCE RESIDUE BUILDUP DURING A FILM D...
- Publication number 20180195174
- Publication date Jul 12, 2018
- ASM IP HOLDING B.V.
- Hyeongeu Kim
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHODS FOR THERMALLY CALIBRATING REACTION CHAMBERS
- Publication number 20180114680
- Publication date Apr 26, 2018
- ASM IP HOLDING B.V.
- Hyeongeu Kim
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Hyeongeu Kim

Person

Patents Grantslast 30 patents

Reactor system and method to reduce residue buildup during a film d...

System and method for thermally calibrating semiconductor process c...

Reactor system and method to reduce residue buildup during a film d...

Methods for thermally calibrating reaction chambers

System and method for thermally calibrating semiconductor process c...

Methods for thermally calibrating reaction chambers

Patents Applicationslast 30 patents

REACTOR SYSTEM AND METHOD TO REDUCE RESIDUE BUILDUP DURING A FILM D...

SYSTEM AND METHOD FOR THERMALLY CALIBRATING SEMICONDUCTOR PROCESS C...

METHODS FOR THERMALLY CALIBRATING REACTION CHAMBERS

SYSTEM AND METHOD FOR THERMALLY CALIBRATING SEMICONDUCTOR PROCESS C...

REACTOR SYSTEM AND METHOD TO REDUCE RESIDUE BUILDUP DURING A FILM D...

METHODS FOR THERMALLY CALIBRATING REACTION CHAMBERS