HYO GEUN CHAE

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CHUNGCHEONGNAM-DO, KR

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Patents Grantslast 30 patents

Information Patent Grant
Test kit for semiconductor package and method for testing semicondu...
- Patent number 7,017,428
- Issue date Mar 28, 2006
- Samsung Electronics Co., Ltd.
- Byoung-jun Min
- G01 - MEASURING TESTING
Information Patent Grant
Wafer treatment method for protecting fuse box of semiconductor chip
- Patent number 6,841,425
- Issue date Jan 11, 2005
- Samsung Electronics Co., Ltd.
- Jae-Il Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Socket including pressure conductive rubber and mesh for testing of...
- Patent number 6,489,790
- Issue date Dec 3, 2002
- Samsung Electronics Co., Ltd.
- Young-soo An
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor package testing equipment including loader having pac...
- Patent number 6,462,534
- Issue date Oct 8, 2002
- Samsung Electronics Co., Ltd.
- Seong-goo Kang
- G01 - MEASURING TESTING
Information Patent Grant
Socket pin and socket for electrical testing of semiconductor packages
- Patent number 6,396,294
- Issue date May 28, 2002
- Samsung Electronics Co., Ltd.
- Young-soo An
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test kit for semiconductor package and method for testing semicondu...
- Publication number 20040112142
- Publication date Jun 17, 2004
- Byoung-Jun Min
- G01 - MEASURING TESTING
Information Patent Application
Wafer treatment method for protecting fuse box of semiconductor chip
- Publication number 20030080360
- Publication date May 1, 2003
- Samsung Electronics Co., Ltd.
- Jae-Il Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for detecting defective markings on a semicond...
- Publication number 20020092910
- Publication date Jul 18, 2002
- Samsung Electronics Co., Ltd.
- Sung-Muk Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOCKET, CIRCUIT BOARD, AND SUB-CIRCUIT BOARD FOR SEMICONDUCTOR INTE...
- Publication number 20020037672
- Publication date Mar 28, 2002
- BYOUNG JUN MIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOCKET PIN AND SOCKET FOR ELECTRICAL TESTING OF SEMICONDUCTOR PACKAGES
- Publication number 20020011864
- Publication date Jan 31, 2002
- YOUNG-SOO AN
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor package testing equipment including loader having pac...
- Publication number 20010026152
- Publication date Oct 4, 2001
- Seong-goo Kang
- G01 - MEASURING TESTING