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Dual image sensor
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Patent number 11,996,430
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Issue date May 28, 2024
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Samsung Electronics Co., Ltd.
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Hyochul Kim
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H01 - BASIC ELECTRIC ELEMENTS
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Spectral imaging apparatus
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Patent number 11,686,620
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Issue date Jun 27, 2023
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Samsung Electronics Co., Ltd.
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Hyochul Kim
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G02 - OPTICS
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Spectral imaging apparatus
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Patent number 11,175,182
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Issue date Nov 16, 2021
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Samsung Electronics Co., Ltd.
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Hyochul Kim
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G01 - MEASURING TESTING
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Dual image sensor
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Patent number 11,024,662
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Issue date Jun 1, 2021
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Samsung Electronics Co., Ltd.
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Hyochul Kim
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H01 - BASIC ELECTRIC ELEMENTS
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Spectrometer
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Patent number 10,895,499
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Issue date Jan 19, 2021
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Samsung Electronics Co., Ltd.
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Youngzoon Yoon
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G01 - MEASURING TESTING
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Spectrometer
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Patent number 10,605,658
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Issue date Mar 31, 2020
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Samsung Electronics Co., Ltd.
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Youngzoon Yoon
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G01 - MEASURING TESTING
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Tunable laser device
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Patent number 10,511,148
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Issue date Dec 17, 2019
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Samsung Electronics Co., Ltd.
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Jineun Kim
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H01 - BASIC ELECTRIC ELEMENTS
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