Hyock-Jun Lee

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Incheon, KR

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Patents Grantslast 30 patents

Information Patent Grant
Test pattern and method of monitoring defects using the same
- Patent number 7,705,621
- Issue date Apr 27, 2010
- Samsung Electronics Co., Ltd.
- Hyock-Jun Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST PATTERN AND METHOD OF MONITORING DEFECTS USING THE SAME
- Publication number 20080084223
- Publication date Apr 10, 2008
- Hyock-Jun Lee
- G01 - MEASURING TESTING