Hyoseok Daniel YANG

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Oblique illuminator for inspecting manufactured substrates
- Patent number 9,423,357
- Issue date Aug 23, 2016
- KLA-Tencor Corporation
- Shiyu Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Oblique illuminator for inspecting manufactured substrates
- Patent number 8,794,801
- Issue date Aug 5, 2014
- KLA-Tencor Corporation
- Shiyu Zhang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OBLIQUE ILLUMINATOR FOR INSPECTING MANUFACTURED SUBSTRATES
- Publication number 20140299779
- Publication date Oct 9, 2014
- KLA-Tencor Corporation
- Shiyu ZHANG
- G01 - MEASURING TESTING
Information Patent Application
OBLIQUE ILLUMINATOR FOR INSPECTING MANUFACTURED SUBSTRATES
- Publication number 20120218545
- Publication date Aug 30, 2012
- KLA-Tencor Corporation
- Shiyu Zhang
- G01 - MEASURING TESTING
Information Patent Application
Probe card having cantilever probes
- Publication number 20080106292
- Publication date May 8, 2008
- Corad Technology, Inc.
- Ka Ng Chui
- G01 - MEASURING TESTING
Information Patent Application
Probe card having vertical probes
- Publication number 20080048685
- Publication date Feb 28, 2008
- Corad Technology Inc.
- Ka Ng Chui
- G01 - MEASURING TESTING
Information Patent Application
Fiber optic coupling assembly and apparatus and method for making same
- Publication number 20030169980
- Publication date Sep 11, 2003
- Alvesta Corporation
- Hyoseok Daniel Yang
- G02 - OPTICS