Hyosig Won

Person

Suwon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Method for routing between pins of semiconductor device and design...
- Patent number 10,509,884
- Issue date Dec 17, 2019
- Samsung Electronics Co., Ltd.
- Hyosig Won
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for routing between pins of semiconductor device and design...
- Patent number 10,248,752
- Issue date Apr 2, 2019
- Samsung Electronics Co., Ltd.
- Hyosig Won
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device for testing large number of devices and compos...
- Patent number 10,026,661
- Issue date Jul 17, 2018
- Samsung Electronics Co., Ltd.
- Hyosig Won
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit layout design system and method
- Patent number 9,652,580
- Issue date May 16, 2017
- Samsung Electronics Co., Ltd.
- Taejoong Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 9,536,946
- Issue date Jan 3, 2017
- Samsung Electronics Co., Ltd.
- Jae-Ho Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor devices
- Patent number 9,496,179
- Issue date Nov 15, 2016
- Samsung Electronics Co., Ltd.
- Jung-Ho Do
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System on chip and temperature control method thereof
- Patent number 9,459,680
- Issue date Oct 4, 2016
- Samsung Electronics Co., Ltd.
- Hyungock Kim
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR ROUTING BETWEEN PINS OF SEMICONDUCTOR DEVICE AND DESIGN...
- Publication number 20190188354
- Publication date Jun 20, 2019
- Samsung Electronics Co., Ltd.
- Hyosig WON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20180226303
- Publication date Aug 9, 2018
- Samsung Electronics Co., Ltd.
- HYOSIG WON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ROUTING BETWEEN PINS OF SEMICONDUCTOR DEVICE AND DESIGN...
- Publication number 20170199955
- Publication date Jul 13, 2017
- Samsung Electronics Co., Ltd.
- Hyosig WON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE FOR TESTING LARGE NUMBER OF DEVICES AND COMPOS...
- Publication number 20160086863
- Publication date Mar 24, 2016
- Hyosig WON
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES
- Publication number 20160056083
- Publication date Feb 25, 2016
- Samsung Electronics Co., Ltd.
- JUNG-HO DO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20160056155
- Publication date Feb 25, 2016
- Samsung Electronics Co., Ltd.
- JAE-HO PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT LAYOUT DESIGN SYSTEM AND METHOD
- Publication number 20160026749
- Publication date Jan 28, 2016
- TAEJOONG SONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM ON CHIP AND TEMPERATURE CONTROL METHOD THEREOF
- Publication number 20140032949
- Publication date Jan 30, 2014
- Hyungock KIM
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Method for routing between pins of semiconductor device and design...

Method for routing between pins of semiconductor device and design...

Semiconductor device for testing large number of devices and compos...

Integrated circuit layout design system and method

Semiconductor device and method for manufacturing the same

Method of manufacturing semiconductor devices

System on chip and temperature control method thereof

Patents Applicationslast 30 patents

METHOD FOR ROUTING BETWEEN PINS OF SEMICONDUCTOR DEVICE AND DESIGN...

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

METHOD FOR ROUTING BETWEEN PINS OF SEMICONDUCTOR DEVICE AND DESIGN...

SEMICONDUCTOR DEVICE FOR TESTING LARGE NUMBER OF DEVICES AND COMPOS...

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

INTEGRATED CIRCUIT LAYOUT DESIGN SYSTEM AND METHOD

SYSTEM ON CHIP AND TEMPERATURE CONTROL METHOD THEREOF