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Hyowon Park
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Milpitas, CA, US
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last 30 patents
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Patent Grant
Methods and systems for targeted monitoring of semiconductor measur...
Patent number
12,019,030
Issue date
Jun 25, 2024
KLA Corporation
Antonio Arion Gellineau
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Methods And Systems For Model-less, Scatterometry Based Measurement...
Publication number
20240085321
Publication date
Mar 14, 2024
KLA Corporation
John Hench
G01 - MEASURING TESTING
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Patent Application
Methods And Systems For Targeted Monitoring Of Semiconductor Measur...
Publication number
20230228692
Publication date
Jul 20, 2023
KLA Corporation
Antonio Arion Gellineau
G01 - MEASURING TESTING
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Patent Application
Methods And Systems For Data Driven Parameterization And Measuremen...
Publication number
20230169255
Publication date
Jun 1, 2023
KLA Corporation
Stilian Ivanov Pandev
G06 - COMPUTING CALCULATING COUNTING