Hyowon Park

Follow

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for targeted monitoring of semiconductor measur...
- Patent number 12,019,030
- Issue date Jun 25, 2024
- KLA Corporation
- Antonio Arion Gellineau
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-Ray Scatterometry Based Measurements Of Memory Array Structures S...
- Publication number 20240302301
- Publication date Sep 12, 2024
- KLA Corporation
- Sandeep Inampudi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods And Systems For Model-less, Scatterometry Based Measurement...
- Publication number 20240085321
- Publication date Mar 14, 2024
- KLA Corporation
- John Hench
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Targeted Monitoring Of Semiconductor Measur...
- Publication number 20230228692
- Publication date Jul 20, 2023
- KLA Corporation
- Antonio Arion Gellineau
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Data Driven Parameterization And Measuremen...
- Publication number 20230169255
- Publication date Jun 1, 2023
- KLA Corporation
- Stilian Ivanov Pandev
- G06 - COMPUTING CALCULATING COUNTING