Hyrum Anderson

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Albuquerque, NM, US

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Patents Grantslast 30 patents

Information Patent Grant
Joint synthetic aperture radar plus ground moving target indicator...
- Patent number 9,791,563
- Issue date Oct 17, 2017
- National Technology & Engineering Solutions of Sandia, LLC
- Douglas Thompson
- G01 - MEASURING TESTING
Information Patent Grant
Sparse sampling and reconstruction for electron and scanning probe...
- Patent number 9,093,249
- Issue date Jul 28, 2015
- Sandia Corporation
- Hyrum Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast electron microscopy via compressive sensing
- Patent number 8,907,280
- Issue date Dec 9, 2014
- Sandia Corporation
- Kurt W. Larson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPARSE SAMPLING AND RECONSTRUCTION FOR ELECTRON AND SCANNING PROBE...
- Publication number 20150069233
- Publication date Mar 12, 2015
- SANDIA CORPORATION
- Hyrum Anderson
- H01 - BASIC ELECTRIC ELEMENTS