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Hyug-Gyo Rhee
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Daejeon, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Device and method for measuring thickness and refractive index of m...
Patent number
11,906,281
Issue date
Feb 20, 2024
Korea Research Institute of Standards and Science
Young-Sik Ghim
G01 - MEASURING TESTING
Information
Patent Grant
System and method for 3D shape measurement of freeform surface base...
Patent number
11,486,700
Issue date
Nov 1, 2022
Korea Research Institute of Standards and Science
Young-Sik Ghim
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring the thickness and refractive ind...
Patent number
11,466,978
Issue date
Oct 11, 2022
KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE
Young-sik Ghim
G01 - MEASURING TESTING
Information
Patent Grant
System and method for compensating for non-linear response characte...
Patent number
11,255,662
Issue date
Feb 22, 2022
Korea Research Institute of Standards and Science
Young-sik Ghim
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for multilayer thin film thickness measurement...
Patent number
11,243,070
Issue date
Feb 8, 2022
Korea Research Institute of Standards and Science
Young-Sik Ghim
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring thickness and surface profile of multilayer...
Patent number
10,466,031
Issue date
Nov 5, 2019
Korea Research Institute of Standards and Science
Young-Sik Ghim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Correction of rotational inaccuracy in lateral shearing interferometry
Patent number
9,863,814
Issue date
Jan 9, 2018
Korea Research Institute of Standards and Science
Hyug-Gyo Rhee
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for manufacturing fine pattern using interfero...
Patent number
9,707,714
Issue date
Jul 18, 2017
Korea Research Institute of Standards and Science
Hyug-Gyo Rhee
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Apparatus for forming fine patterns capable of switching direction...
Patent number
9,223,223
Issue date
Dec 29, 2015
Korea Research Institute of Standards and Science
Hyug-Gyo Rhee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
REAL-TIME THREE-DIMENSIONAL SHAPE MEASUREMENT SYSTEM AND SHAPE MEAS...
Publication number
20230358532
Publication date
Nov 9, 2023
KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE
Young-Sik GHIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CALIBRATION METHOD FOR DEFLECTOMETRY METHOD, FOR IMPROVING MEASUREM...
Publication number
20230358531
Publication date
Nov 9, 2023
KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE
Young-Sik GHIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
VIBRATION INSENSITIVE INTERFEROMETRY FOR MEASURING THICKNESS AND PR...
Publication number
20230042414
Publication date
Feb 9, 2023
Korean Research Institute of Standard and Science
Yong-sik Ghim
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MEASURING THE THICKNESS AND REFRACTIVE IND...
Publication number
20220003539
Publication date
Jan 6, 2022
KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE
Young-sik Ghim
G01 - MEASURING TESTING
Information
Patent Application
System and Method for 3D Shape Measurement of Freeform Surface Base...
Publication number
20210404797
Publication date
Dec 30, 2021
Korea Research Institute of Standards and Science
Young-Sik GHIM
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR MEASURING THICKNESS AND REFRACTIVE INDEX OF M...
Publication number
20210341283
Publication date
Nov 4, 2021
Korea Research Institute of Standards and Science
Young-Sik GHIM
G02 - OPTICS
Information
Patent Application
APPARATUS AND METHOD FOR MULTILAYER THIN FILM THICKNESS MEASUREMENT...
Publication number
20210285756
Publication date
Sep 16, 2021
Korea Research Institute of Standards and Science
Young-Sik GHIM
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR COMPENSATING FOR NON-LINEAR RESPONSE CHARACTE...
Publication number
20210172731
Publication date
Jun 10, 2021
Korea Research Institute of Standards and Science
Young-sik Ghim
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR MEASURING THICKNESS AND SURFACE PROFILE OF MULTILAYER...
Publication number
20190101373
Publication date
Apr 4, 2019
Young-Sik GHIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPERATING METHOD OF FIRST DERIVATIVE MEASURING APPARATUS
Publication number
20150146213
Publication date
May 28, 2015
Korea Research Institute of Standards and Science
Hyug-Gyo RHEE
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MANUFACTURING FINE PATTERN USING INTERFERO...
Publication number
20130234368
Publication date
Sep 12, 2013
Korea Research Institute of Standards and Science
Hyug-Gyo Rhee
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Application
APPARATUS FOR FORMING FINE PATTERNS CAPABLE OF SWITCHING DIRECTION...
Publication number
20130194558
Publication date
Aug 1, 2013
Korea Research Institute of Standards and Science
Hyug-Gyo Rhee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY