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Hyung Jung Yong
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Suwon-si, KR
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Patents Grants
last 30 patents
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Patent Grant
System to test electronic part and method of controlling the same
Patent number
7,820,994
Issue date
Oct 26, 2010
Samsung Electronics Co., Ltd.
Seono Kim
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PLASMA TREATMENT APPARATUS, A METHOD OF MONITORING A PROCESS OF MAN...
Publication number
20220181219
Publication date
Jun 9, 2022
Samsung Electronics Co., Ltd.
MEEHYUN LIM
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
TEST SYSTEM FOR TESTING A CMOS IMAGE SENSOR AND A DRIVING METHOD TH...
Publication number
20140145745
Publication date
May 29, 2014
Samsung Electronics Co., Ltd.
Hyung-Sun Ryu
G01 - MEASURING TESTING
Information
Patent Application
System to test electronic part and method of controlling the same
Publication number
20080243428
Publication date
Oct 2, 2008
Samsung Electronics Co., Ltd.
Seono Kim
G01 - MEASURING TESTING