Hyung-pyo HONG

Person

Seongnam-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Composition for removing silicone resins and method of thinning sub...
- Patent number 10,894,935
- Issue date Jan 19, 2021
- Samsung Electronics Co., Ltd.
- In-goo Kang
- B32 - LAYERED PRODUCTS
Information Patent Grant
Texture-etchant composition for crystalline silicon wafer and metho...
- Patent number 9,305,792
- Issue date Apr 5, 2016
- Dongwoo Fine-Chem Co., Ltd.
- Hyung-Pyo Hong
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Ion implanting apparatus and ion implanting method using the same
- Patent number 7,112,810
- Issue date Sep 26, 2006
- Samsung Electronics Co., Ltd.
- Gyeong-Su Keum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for exposing a peripheral area of a wafer and apparatus for...
- Patent number 6,924,072
- Issue date Aug 2, 2005
- Samsung Electronics Co., Ltd.
- Hyung-Sik Hong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Polarity exchanger and ion implanter having the same
- Patent number 6,903,336
- Issue date Jun 7, 2005
- Samsung Electronics Co., Ltd.
- Gyeong-Su Keum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pedestal of a load-cup which supports wafers loaded/unloaded onto/f...
- Patent number 6,860,801
- Issue date Mar 1, 2005
- Samsung Electronics Co., Ltd.
- Yun-sik Yang
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for measuring inclination angle of ion beam
- Patent number 6,858,854
- Issue date Feb 22, 2005
- Samsung Electronics Co., Ltd.
- Gyeong-Su Keum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for exposing a peripheral area of a wafer and apparatus for...
- Patent number 6,795,162
- Issue date Sep 21, 2004
- Samsung Electronics Co., Ltd.
- Hyung-Sik Hong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Heater assembly for heating a wafer
- Patent number 6,720,533
- Issue date Apr 13, 2004
- Samsung Electronics Co., Ltd.
- Gyeong-Su Keum
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of and apparatus for use in orienting an object at a referen...
- Patent number 6,705,020
- Issue date Mar 16, 2004
- Samsung Electronics Co, Ltd.
- Gyeong-Su Keum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Real time parameter monitoring apparatus for high voltage chamber i...
- Patent number 6,590,378
- Issue date Jul 8, 2003
- Samsung Electronics Co., Ltd.
- Sang-Mun Chon
- G01 - MEASURING TESTING
Information Patent Grant
Pedestal of a load-cup which supports wafers loaded/unloaded onto/f...
- Patent number 6,537,143
- Issue date Mar 25, 2003
- Samsung Electronics Co., Ltd.
- Yun-sik Yang
- B24 - GRINDING POLISHING
Information Patent Grant
Wafer aligning apparatus for semiconductor device fabrication
- Patent number 6,099,242
- Issue date Aug 8, 2000
- Samsung Electronics Co., Ltd.
- Hyung-sik Hong
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
COMPOSITION FOR REMOVING SILICONE RESINS AND METHOD OF THINNING SUB...
- Publication number 20180265819
- Publication date Sep 20, 2018
- Samsung Electronics Co., Ltd.
- In-goo KANG
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
EXTENDED PHOTOVOLTAIC MODULE FIXTURE
- Publication number 20170353148
- Publication date Dec 7, 2017
- Soonchunhyang University Industry Academy Cooperation Foundation
- Hyung Eui HONG
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
COMPOSITION FOR REMOVING SILICONE RESINS AND METHOD OF THINNING SUB...
- Publication number 20170158888
- Publication date Jun 8, 2017
- DONGWOO FINE-CHEM CO., LTD
- In-goo KANG
- B32 - LAYERED PRODUCTS
Information Patent Application
MOBILE CARD SERVICE METHOD UTILIZING HCE, AND MOBILE TERMINAL APPLY...
- Publication number 20170132618
- Publication date May 11, 2017
- MOZIDO CORFIRE - KOREA, LTD.
- Hyung Joon HONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ETCHANT COMPOSITION FOR TITANIUM NITRIDE LAYER AND METHOD FOR FORMI...
- Publication number 20160257880
- Publication date Sep 8, 2016
- DONGWOO FINE-CHEM CO., LTD.
- Hyung-Pyo Hong
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
TEXTURE-ETCHANT COMPOSITION FOR CRYSTALLINE SILICON WAFER AND METHO...
- Publication number 20130143403
- Publication date Jun 6, 2013
- DONGWOO FINE-CHEM CO., LTD.
- Hyung-Pyo Hong
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
TEXTURE-ETCHANT COMPOSITION FOR CRYSTALLINE SILICON WAFER AND METHO...
- Publication number 20130137278
- Publication date May 30, 2013
- DONGWOO FINE-CHEM CO., LTD.
- Hyung-Pyo Hong
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
Method of manufacturing semiconductor device
- Publication number 20100267225
- Publication date Oct 21, 2010
- Hyo-san Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of forming metallization in a semiconductor device using sel...
- Publication number 20100068881
- Publication date Mar 18, 2010
- Joo-ho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE TREATMENT APPARATUS AND CLEANING METHOD
- Publication number 20080041308
- Publication date Feb 21, 2008
- Samsung Electronics Co., Ltd.
- Hyung-Sik HONG
- B08 - CLEANING
Information Patent Application
Ion implanting apparatus and ion implanting method using the same
- Publication number 20050133737
- Publication date Jun 23, 2005
- Gyeong-Su Keum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Chemical vapor deposition processing equipment for use in fabricati...
- Publication number 20050022742
- Publication date Feb 3, 2005
- Hyung-Sik Hong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method for exposing a peripheral area of a wafer and apparatus for...
- Publication number 20040241886
- Publication date Dec 2, 2004
- Samsung Electronics Co., Ltd.
- Hyung-Sik Hong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Polarity exchanger and ion implanter having the same
- Publication number 20040113100
- Publication date Jun 17, 2004
- Gyeong-Su Keum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for measuring inclination angle of ion beam
- Publication number 20030197132
- Publication date Oct 23, 2003
- Gyeong-Su Keum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic chuck of an ion implanter
- Publication number 20030107866
- Publication date Jun 12, 2003
- Tae-Won Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Heater assembly for heating a wafer
- Publication number 20030047555
- Publication date Mar 13, 2003
- Gyeong-Su Keum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pedestal of a load-cup which supports wafers loaded/unloaded onto/f...
- Publication number 20030045219
- Publication date Mar 6, 2003
- Yun-Sik Yang
- B24 - GRINDING POLISHING
Information Patent Application
Method of and apparatus for use in orienting an object at a referen...
- Publication number 20020166979
- Publication date Nov 14, 2002
- Gyeong-Su Keum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for exposing a peripheral area of a wafer and apparatus for...
- Publication number 20020127485
- Publication date Sep 12, 2002
- Hyung-Sik Hong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Parameter monitoring apparatus for high voltage chamber in semicond...
- Publication number 20020067177
- Publication date Jun 6, 2002
- Sang-Mun Chon
- G01 - MEASURING TESTING

Hyung-pyo HONG

Person

Patents Grantslast 30 patents

Composition for removing silicone resins and method of thinning sub...

Texture-etchant composition for crystalline silicon wafer and metho...

Ion implanting apparatus and ion implanting method using the same

Method for exposing a peripheral area of a wafer and apparatus for...

Polarity exchanger and ion implanter having the same

Pedestal of a load-cup which supports wafers loaded/unloaded onto/f...

Method and apparatus for measuring inclination angle of ion beam

Method for exposing a peripheral area of a wafer and apparatus for...

Heater assembly for heating a wafer

Method of and apparatus for use in orienting an object at a referen...

Real time parameter monitoring apparatus for high voltage chamber i...

Pedestal of a load-cup which supports wafers loaded/unloaded onto/f...

Wafer aligning apparatus for semiconductor device fabrication

Patents Applicationslast 30 patents

COMPOSITION FOR REMOVING SILICONE RESINS AND METHOD OF THINNING SUB...

EXTENDED PHOTOVOLTAIC MODULE FIXTURE

COMPOSITION FOR REMOVING SILICONE RESINS AND METHOD OF THINNING SUB...

MOBILE CARD SERVICE METHOD UTILIZING HCE, AND MOBILE TERMINAL APPLY...

ETCHANT COMPOSITION FOR TITANIUM NITRIDE LAYER AND METHOD FOR FORMI...

TEXTURE-ETCHANT COMPOSITION FOR CRYSTALLINE SILICON WAFER AND METHO...

TEXTURE-ETCHANT COMPOSITION FOR CRYSTALLINE SILICON WAFER AND METHO...

Method of manufacturing semiconductor device

Method of forming metallization in a semiconductor device using sel...

SUBSTRATE TREATMENT APPARATUS AND CLEANING METHOD

Ion implanting apparatus and ion implanting method using the same

Chemical vapor deposition processing equipment for use in fabricati...

Method for exposing a peripheral area of a wafer and apparatus for...

Polarity exchanger and ion implanter having the same

Method and apparatus for measuring inclination angle of ion beam

Electrostatic chuck of an ion implanter

Heater assembly for heating a wafer

Pedestal of a load-cup which supports wafers loaded/unloaded onto/f...

Method of and apparatus for use in orienting an object at a referen...

Method for exposing a peripheral area of a wafer and apparatus for...

Parameter monitoring apparatus for high voltage chamber in semicond...