Hyungjung Yong

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Seongnam-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor test device and system and test method using the same
- Patent number 11,782,085
- Issue date Oct 10, 2023
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME
- Publication number 20230408574
- Publication date Dec 21, 2023
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RF GENERATING DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCL...
- Publication number 20230118000
- Publication date Apr 20, 2023
- Samsung Electronics Co., Ltd.
- Sungyong Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME
- Publication number 20210156904
- Publication date May 27, 2021
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS