Hyungsuk Cho

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
System and method of inspecting substrate and method of fabricating...
- Patent number 10,393,672
- Issue date Aug 27, 2019
- Samsung Electronics Co., Ltd.
- Jeongho Ahn
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD OF INSPECTING SUBSTRATE AND METHOD OF FABRICATING...
- Publication number 20190033232
- Publication date Jan 31, 2019
- Samsung Electronics Co., Ltd.
- JEONGHO AHN
- G02 - OPTICS
Information Patent Application
ROTATION ANGLE MEASUREMENT MARKS AND METHODS OF MEASURING ROTATION...
- Publication number 20170146340
- Publication date May 25, 2017
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- G01 - MEASURING TESTING