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Hyungsun RYU
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Suwon-si, KR
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Patents Grants
last 30 patents
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Patent Grant
Interface board for testing image sensor, test system having the sa...
Patent number
12,328,424
Issue date
Jun 10, 2025
Samsung Electronics Co., Ltd.
Shinki Jeong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Image sensor test system including operational amplifier and low-fr...
Patent number
12,309,353
Issue date
May 20, 2025
Samsung Electronics Co., Ltd.
Seongkwan Lee
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Wafer-level multi-device tester and system including the same preli...
Patent number
12,105,146
Issue date
Oct 1, 2024
Samsung Electronics Co., Ltd.
Seongkwan Lee
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME
Publication number
20240085478
Publication date
Mar 14, 2024
Samsung Electronics Co., Ltd.
Seongkwan Lee
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TESTING IMAGE SENSOR AND OPERATING METHOD THEREOF
Publication number
20240053391
Publication date
Feb 15, 2024
Samsung Electronics Co., Ltd.
Seongkwan Lee
G01 - MEASURING TESTING
Information
Patent Application
IMAGE SENSOR TEST SYSTEM
Publication number
20230362350
Publication date
Nov 9, 2023
Samsung Electronics Co., Ltd.
Seongkwan Lee
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
INTERFACE BOARD FOR TESTING IMAGE SENSOR, TEST SYSTEM HAVING THE SA...
Publication number
20230047664
Publication date
Feb 16, 2023
Samsung Electronics Co., Ltd.
Shinki JEONG
H01 - BASIC ELECTRIC ELEMENTS