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Hyunmin Kwon
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Jeonju-si, KR
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last 30 patents
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Patent Grant
Test apparatus for testing semiconductor packages and automatic tes...
Patent number
11,614,483
Issue date
Mar 28, 2023
Samsung Electronics Co., Ltd.
Dahm Yu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
APPARATUS AND METHOD OF TESTING AN OBJECT WITHIN A DRY GAS ENVIRONMENT
Publication number
20220178815
Publication date
Jun 9, 2022
Samsung Electronics Co., Ltd.
Dahm Yu
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS FOR TESTING SEMICONDUCTOR PACKAGES AND AUTOMATIC TES...
Publication number
20210325450
Publication date
Oct 21, 2021
Samsung Electronics Co., Ltd.
Dahm Yu
G01 - MEASURING TESTING