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Patents Grants
last 30 patents
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Patent Grant
Circuit and method to detect defects in a power switching device
Patent number
11,435,395
Issue date
Sep 6, 2022
Semiconductor Components Industries, LLC
Junho Lee
G01 - MEASURING TESTING
Information
Patent Grant
Bi-directional transmitter/receiver comprising temperature sensor a...
Patent number
10,090,668
Issue date
Oct 2, 2018
Semiconductor Components Industries, LLC
Jinkyu Choi
G01 - MEASURING TESTING
Information
Patent Grant
Bi-directional transmitter/receiver comprising temperature sensor a...
Patent number
9,735,565
Issue date
Aug 15, 2017
Fairchild Korea Semiconductor Ltd.
Jinkyu Choi
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
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Patent Application
CIRCUIT AND METHOD TO DETECT DEFECTS IN A POWER SWITCHING DEVICE
Publication number
20210318375
Publication date
Oct 14, 2021
Semiconductor Components Industries, LLC
JunHo LEE
G01 - MEASURING TESTING
Information
Patent Application
BI-DIRECTIONAL TRANSMITTER/RECEIVER COMPRISING TEMPERATURE SENSOR A...
Publication number
20170310101
Publication date
Oct 26, 2017
Fairchild Korea Semiconductor, Ltd.
Jinkyu CHOI
G01 - MEASURING TESTING
Information
Patent Application
BI-DIRECTIONAL TRANSMITTER/RECEIVER COMPRISING TEMPERATURE SENSOR A...
Publication number
20150381152
Publication date
Dec 31, 2015
Fairchild Korea Semiconductor Ltd.
Jinkyu CHOI
G01 - MEASURING TESTING