Hyunui LEE

Person

Osan-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Memory device including parity error detection circuit
- Patent number 10,938,416
- Issue date Mar 2, 2021
- Samsung Electronics Co., Ltd.
- Hye-Seung Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device including a shift register
- Patent number 10,908,212
- Issue date Feb 2, 2021
- Samsung Electronics Co., Ltd.
- Hyunui Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Short circuit detecting device of stacked memory chips and method t...
- Patent number 10,509,070
- Issue date Dec 17, 2019
- Samsung Electronics Co., Ltd.
- Won-Joo Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device including parity error detection circuit
- Patent number 10,243,584
- Issue date Mar 26, 2019
- Samsung Electronics Co., Ltd.
- Hye-Seung Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Short circuit detecting device of stacked memory chips and method t...
- Patent number 10,078,110
- Issue date Sep 18, 2018
- Samsung Electronics Co., Ltd.
- Won-Joo Yun
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Memory device for performing calibration operation
- Patent number 9,870,808
- Issue date Jan 16, 2018
- Samsung Electronics Co., Ltd.
- Hyunui Lee
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE
- Publication number 20190271742
- Publication date Sep 5, 2019
- Samsung Electronics Co., Ltd.
- Hyunui Lee
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE INCLUDING PARITY ERROR DETECTION CIRCUIT
- Publication number 20190165808
- Publication date May 30, 2019
- Samsung Electronics Co., Ltd.
- Hye-Seung YU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHORT CIRCUIT DETECTING DEVICE OF STACKED MEMORY CHIPS AND METHOD T...
- Publication number 20180356458
- Publication date Dec 13, 2018
- Samsung Electronics Co., Ltd.
- Won-Joo YUN
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE INCLUDING INTERPOSER AND SYSTEM-IN-PACKAGE INCLUDING...
- Publication number 20180026013
- Publication date Jan 25, 2018
- Won-Joo YUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE INCLUDING PARITY ERROR DETECTION CIRCUIT
- Publication number 20170331493
- Publication date Nov 16, 2017
- Samsung Electronics Co., Ltd.
- Hye-Seung YU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHORT CIRCUIT DETECTING DEVICE OF STACKED MEMORY CHIPS AND METHOD T...
- Publication number 20170219647
- Publication date Aug 3, 2017
- Samsung Electronics Co., Ltd.
- Won-Joo YUN
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE FOR PERFORMING CALIBRATION OPERATION
- Publication number 20170162238
- Publication date Jun 8, 2017
- Samsung Electronics Co., Ltd.
- Hyunui LEE
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Memory device including parity error detection circuit

Semiconductor memory device including a shift register

Short circuit detecting device of stacked memory chips and method t...

Memory device including parity error detection circuit

Short circuit detecting device of stacked memory chips and method t...

Memory device for performing calibration operation

Patents Applicationslast 30 patents

MEMORY DEVICE

MEMORY DEVICE INCLUDING PARITY ERROR DETECTION CIRCUIT

SHORT CIRCUIT DETECTING DEVICE OF STACKED MEMORY CHIPS AND METHOD T...

MEMORY DEVICE INCLUDING INTERPOSER AND SYSTEM-IN-PACKAGE INCLUDING...

MEMORY DEVICE INCLUDING PARITY ERROR DETECTION CIRCUIT

SHORT CIRCUIT DETECTING DEVICE OF STACKED MEMORY CHIPS AND METHOD T...

MEMORY DEVICE FOR PERFORMING CALIBRATION OPERATION