Hyunui Lee

Person

Sagamihara, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Signal delay control and related apparatuses, systems, and methods
- Patent number 11,677,537
- Issue date Jun 13, 2023
- Micron Technology, Inc.
- Hyunui Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Output impedance calibration, and related devices, systems, and met...
- Patent number 11,670,397
- Issue date Jun 6, 2023
- Micron Technology, Inc.
- Hyunui Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Reference-voltage-generators within integrated assemblies
- Patent number 11,646,073
- Issue date May 9, 2023
- Micron Technology, Inc.
- Hyunui Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Output impedance calibration, and related devices, systems, and met...
- Patent number 11,494,198
- Issue date Nov 8, 2022
- Micron Technology, Inc.
- Hyunui Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated assemblies having memory cells with capacitive units and...
- Patent number 11,398,266
- Issue date Jul 26, 2022
- Micron Technology, Inc.
- Hyunui Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Input/output capacitance measurement, and related methods, devices,...
- Patent number 11,302,387
- Issue date Apr 12, 2022
- Micron Technology, Inc.
- Hyunui Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Impedance calibration via a number of calibration circuits, and ass...
- Patent number 11,145,383
- Issue date Oct 12, 2021
- Micron Technology, Inc.
- Hyunui Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Output drivers, and related methods, memory devices, and systems
- Patent number 10,902,907
- Issue date Jan 26, 2021
- Micron Technology, Inc.
- Hyunui Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatuses and methods for providing clocks to data paths
- Patent number 10,839,889
- Issue date Nov 17, 2020
- Micron Technology, Inc.
- Hyunui Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having a test circuit
- Patent number 10,790,039
- Issue date Sep 29, 2020
- Micron Technology, Inc.
- Hyunui Lee
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OUTPUT IMPEDANCE CALIBRATION, AND RELATED DEVICES, SYSTEMS, AND MET...
- Publication number 20220343996
- Publication date Oct 27, 2022
- Micron Technology, Inc.
- Hyunui Lee
- G11 - INFORMATION STORAGE
Information Patent Application
SIGNAL DELAY CONTROL AND RELATED APPARATUSES, SYSTEMS, AND METHODS
- Publication number 20220303111
- Publication date Sep 22, 2022
- Micron Technology, Inc.
- Hyunui Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Reference-Voltage-Generators Within Integrated Assemblies
- Publication number 20220246193
- Publication date Aug 4, 2022
- Micron Technology, Inc.
- Hyunui Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED ASSEMBLIES HAVING MEMORY CELLS WITH CAPACITIVE UNITS AND...
- Publication number 20220223191
- Publication date Jul 14, 2022
- Micron Technology, Inc.
- Hyunui Lee
- G11 - INFORMATION STORAGE
Information Patent Application
OUTPUT IMPEDANCE CALIBRATION, AND RELATED DEVICES, SYSTEMS, AND MET...
- Publication number 20220214890
- Publication date Jul 7, 2022
- Micron Technology, Inc.
- Hyunui Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INPUT/OUTPUT CAPACITANCE MEASUREMENT, AND RELATED METHODS, DEVICES,...
- Publication number 20220013164
- Publication date Jan 13, 2022
- Micron Technology, Inc.
- Hyunui Lee
- G11 - INFORMATION STORAGE
Information Patent Application
IMPEDANCE CALIBRATION VIA A NUMBER OF CALIBRATION CIRCUITS, AND ASS...
- Publication number 20210319840
- Publication date Oct 14, 2021
- Micron Technology, Inc.
- Hyunui Lee
- G11 - INFORMATION STORAGE

Person

Patents Grantslast 30 patents

Signal delay control and related apparatuses, systems, and methods

Output impedance calibration, and related devices, systems, and met...

Reference-voltage-generators within integrated assemblies

Output impedance calibration, and related devices, systems, and met...

Integrated assemblies having memory cells with capacitive units and...

Input/output capacitance measurement, and related methods, devices,...

Impedance calibration via a number of calibration circuits, and ass...

Output drivers, and related methods, memory devices, and systems

Apparatuses and methods for providing clocks to data paths

Semiconductor device having a test circuit

Patents Applicationslast 30 patents

OUTPUT IMPEDANCE CALIBRATION, AND RELATED DEVICES, SYSTEMS, AND MET...

SIGNAL DELAY CONTROL AND RELATED APPARATUSES, SYSTEMS, AND METHODS

Reference-Voltage-Generators Within Integrated Assemblies

INTEGRATED ASSEMBLIES HAVING MEMORY CELLS WITH CAPACITIVE UNITS AND...

OUTPUT IMPEDANCE CALIBRATION, AND RELATED DEVICES, SYSTEMS, AND MET...

INPUT/OUTPUT CAPACITANCE MEASUREMENT, AND RELATED METHODS, DEVICES,...

IMPEDANCE CALIBRATION VIA A NUMBER OF CALIBRATION CIRCUITS, AND ASS...