Hyunyoo Lee

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Die location detection for grouped memory dies
- Patent number 12,020,771
- Issue date Jun 25, 2024
- Micron Technology, Inc.
- Hyunyoo Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Centralized error correction circuit
- Patent number 11,990,199
- Issue date May 21, 2024
- Micron Technology, Inc.
- Taeksang Song
- G11 - INFORMATION STORAGE
Information Patent Grant
Managing address access information
- Patent number 11,947,841
- Issue date Apr 2, 2024
- Micron Technology, Inc.
- Keun Soo Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Internal and external data transfer for stacked memory dies
- Patent number 11,869,626
- Issue date Jan 9, 2024
- Micron Technology, Inc.
- Kang-Yong Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Termination for single-ended mode
- Patent number 11,804,261
- Issue date Oct 31, 2023
- Micron Technology, Inc.
- Keun Soo Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory wear management
- Patent number 11,747,992
- Issue date Sep 5, 2023
- Micron Technology, Inc.
- Saira Samar Malik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Direct testing of in-package memory
- Patent number 11,587,633
- Issue date Feb 21, 2023
- Micron Technology, Inc.
- Taeksang Song
- G11 - INFORMATION STORAGE
Information Patent Grant
Arbitrated sense amplifier
- Patent number 11,514,969
- Issue date Nov 29, 2022
- Micron Technology, Inc.
- Huy T. Vo
- G11 - INFORMATION STORAGE
Information Patent Grant
Die voltage regulation
- Patent number 11,475,937
- Issue date Oct 18, 2022
- Micron Technology, Inc.
- Taeksang Song
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arbitrated sense amplifier
- Patent number 11,074,956
- Issue date Jul 27, 2021
- Micron Technology, Inc.
- Huy T. Vo
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Usage-Based Disturbance Counter Clearance
- Publication number 20240347096
- Publication date Oct 17, 2024
- Micron Technology, Inc.
- Yang Lu
- G11 - INFORMATION STORAGE
Information Patent Application
CENTRALIZED ERROR CORRECTION CIRCUIT
- Publication number 20240347123
- Publication date Oct 17, 2024
- Micron Technology, Inc.
- Taeksang Song
- G11 - INFORMATION STORAGE
Information Patent Application
DIE LOCATION DETECTION FOR GROUPED MEMORY DIES
- Publication number 20240312499
- Publication date Sep 19, 2024
- Micron Technology, Inc.
- Hyunyoo Lee
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGING ADDRESS ACCESS INFORMATION
- Publication number 20240302998
- Publication date Sep 12, 2024
- Micron Technology, Inc.
- Keun Soo Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERNAL AND EXTERNAL DATA TRANSFER FOR STACKED MEMORY DIES
- Publication number 20240161794
- Publication date May 16, 2024
- Micron Technology, Inc.
- Kang-Yong Kim
- G11 - INFORMATION STORAGE
Information Patent Application
INTERNAL AND EXTERNAL DATA TRANSFER FOR STACKED MEMORY DIES
- Publication number 20230121992
- Publication date Apr 20, 2023
- Micron Technology, Inc.
- Kang-Yong Kim
- G11 - INFORMATION STORAGE
Information Patent Application
DIE VOLTAGE REGULATION
- Publication number 20230100397
- Publication date Mar 30, 2023
- Micron Technology, Inc.
- Taeksang Song
- G11 - INFORMATION STORAGE
Information Patent Application
DIE LOCATION DETECTION FOR GROUPED MEMORY DIES
- Publication number 20230052489
- Publication date Feb 16, 2023
- Micron Technology, Inc.
- Hyunyoo Lee
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAMMABLE COLUMN ACCESS
- Publication number 20220406344
- Publication date Dec 22, 2022
- Micron Technology, Inc.
- Hyunyoo Lee
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGING ADDRESS ACCESS INFORMATION
- Publication number 20220398042
- Publication date Dec 15, 2022
- Micron Technology, Inc.
- Keun Soo Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Termination for Single-Ended Mode
- Publication number 20220358994
- Publication date Nov 10, 2022
- Micron Technology, Inc.
- Keun Soo Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CENTRALIZED ERROR CORRECTION CIRCUIT
- Publication number 20220230698
- Publication date Jul 21, 2022
- Micron Technology, Inc.
- Taeksang Song
- G11 - INFORMATION STORAGE
Information Patent Application
ARBITRATED SENSE AMPLIFIER
- Publication number 20220020415
- Publication date Jan 20, 2022
- Micron Technology, Inc.
- Huy T. Vo
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WEAR MANAGEMENT
- Publication number 20220011944
- Publication date Jan 13, 2022
- Micron Technology, Inc.
- Saira Samar Malik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIE VOLTAGE REGULATION
- Publication number 20210407572
- Publication date Dec 30, 2021
- Micron Technology, Inc.
- Taeksang Song
- G11 - INFORMATION STORAGE
Information Patent Application
DIRECT TESTING OF IN-PACKAGE MEMORY
- Publication number 20210398601
- Publication date Dec 23, 2021
- Micron Technology, Inc.
- Taeksang Song
- G11 - INFORMATION STORAGE

Hyunyoo Lee

Person

Patents Grantslast 30 patents

Die location detection for grouped memory dies

Centralized error correction circuit

Managing address access information

Internal and external data transfer for stacked memory dies

Termination for single-ended mode

Memory wear management

Direct testing of in-package memory

Arbitrated sense amplifier

Die voltage regulation

Arbitrated sense amplifier

Patents Applicationslast 30 patents

Usage-Based Disturbance Counter Clearance

CENTRALIZED ERROR CORRECTION CIRCUIT

DIE LOCATION DETECTION FOR GROUPED MEMORY DIES

MANAGING ADDRESS ACCESS INFORMATION

INTERNAL AND EXTERNAL DATA TRANSFER FOR STACKED MEMORY DIES

INTERNAL AND EXTERNAL DATA TRANSFER FOR STACKED MEMORY DIES

DIE VOLTAGE REGULATION

DIE LOCATION DETECTION FOR GROUPED MEMORY DIES

PROGRAMMABLE COLUMN ACCESS

MANAGING ADDRESS ACCESS INFORMATION

Termination for Single-Ended Mode

CENTRALIZED ERROR CORRECTION CIRCUIT

ARBITRATED SENSE AMPLIFIER

MEMORY WEAR MANAGEMENT

DIE VOLTAGE REGULATION

DIRECT TESTING OF IN-PACKAGE MEMORY