I-Chen Chen

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San Diego, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe system comprising an electric-field-aligned probe tip and met...
- Patent number 7,735,147
- Issue date Jun 8, 2010
- The Regents of the University of California
- Sungho Jin
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
PROBE SYSTEM COMPRISING AN ELECTRIC-FIELD-ALIGNED PROBE TIP AND MET...
- Publication number 20100229265
- Publication date Sep 9, 2010
- Sungho Jin
- G01 - MEASURING TESTING
Information Patent Application
Probe System Comprising an Electric-Field-Aligned Probe Tip and Met...
- Publication number 20080272299
- Publication date Nov 6, 2008
- Sungho Jin
- G01 - MEASURING TESTING