I-Hsiu Tseng

Person

Taipei Hsien, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Aging test system and aging test method for thermal interface mater...
- Patent number 12,196,806
- Issue date Jan 14, 2025
- CHROMA ATE INC.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection method and inspection apparatus
- Patent number 11,841,381
- Issue date Dec 12, 2023
- CHROMA ATE INC.
- Tsun-I Wang
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for light emitting diodes
- Patent number 9,429,617
- Issue date Aug 30, 2016
- Chroma Ate Inc.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Solar cell testing system, solar cell testing method, and multifunc...
- Patent number 9,234,933
- Issue date Jan 12, 2016
- CHROMA ATE INC.
- Lan-Sheng Yang
- F21 - LIGHTING
Information Patent Grant
Server system
- Patent number 8,611,080
- Issue date Dec 17, 2013
- Wistron Corporation
- I-Hsiu Tseng
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Light emitting component measuring system and the method thereof
- Patent number 8,525,996
- Issue date Sep 3, 2013
- Chroma Ate Inc.
- Hsu-Ting Cheng
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing light-emitting devices
- Patent number 7,804,589
- Issue date Sep 28, 2010
- Chroma Ate Inc.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring characteristics of liquid crystal d...
- Patent number 6,925,415
- Issue date Aug 2, 2005
- Chroma Ate Inc.
- I-Shih Tseng
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Timing generating apparatus with self-calibrating capability
- Patent number 6,304,119
- Issue date Oct 16, 2001
- Chroma Ate Inc.
- Huan-Ming Tseng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...
- Publication number 20240151746
- Publication date May 9, 2024
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...
- Publication number 20240142492
- Publication date May 2, 2024
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
Liquid cooling system, liquid cooling method and electronic device-...
- Publication number 20230400478
- Publication date Dec 14, 2023
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
AGING TEST SYSTEM AND AGING TEST METHOD FOR THERMAL INTERFACE MATER...
- Publication number 20230375615
- Publication date Nov 23, 2023
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20230105061
- Publication date Apr 6, 2023
- CHROMA ATE INC.
- TSUN-I WANG
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20230105201
- Publication date Apr 6, 2023
- CHROMA ATE INC.
- TSUN-I WANG
- G01 - MEASURING TESTING
Information Patent Application
Apparatus of Identifying Heterogeneous Time-Series Data Expression...
- Publication number 20220114460
- Publication date Apr 14, 2022
- National Central University
- Chih-Yuan Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOLAR CELL TESTING SYSTEM, SOLAR CELL TESTING METHOD, AND MULTIFUNC...
- Publication number 20130265077
- Publication date Oct 10, 2013
- CHROMA ATE INC.
- Lan-Sheng YANG
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS FOR LIGHT EMITTING DIODES
- Publication number 20130015859
- Publication date Jan 17, 2013
- Chroma ATE Inc.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT SYSTEM AND THE DEVICE THEREOF
- Publication number 20120320369
- Publication date Dec 20, 2012
- Chroma ATE Inc.
- Hsu-Ting Cheng
- G01 - MEASURING TESTING
Information Patent Application
Light Emitting Component Measuring System and The Method Thereof
- Publication number 20120250021
- Publication date Oct 4, 2012
- Chroma ATE Inc.
- Hsu-Ting Cheng
- G01 - MEASURING TESTING
Information Patent Application
Server system
- Publication number 20110292587
- Publication date Dec 1, 2011
- Wistron Corporation
- I-Hsiu Tseng
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEM AND METHOD FOR TESTING LIGHT-EMITTING DEVICES
- Publication number 20090309606
- Publication date Dec 17, 2009
- CHROMA ATE INC.
- I-SHIH TSENG
- G01 - MEASURING TESTING
Information Patent Application
Top mount surface airflow heatsink and top mount heatsink component...
- Publication number 20090161311
- Publication date Jun 25, 2009
- Chroma Ate, Inc
- I-Shih Tseng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Surface airflow heatsink device and the heatsink device components
- Publication number 20080266797
- Publication date Oct 30, 2008
- Chroma ATE Inc.
- I-Shih Tseng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for measuring characteristics of liquid crystal d...
- Publication number 20030171883
- Publication date Sep 11, 2003
- I-Shih Tseng
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

I-Hsiu Tseng

Person

Patents Grantslast 30 patents

Aging test system and aging test method for thermal interface mater...

Wafer inspection method and inspection apparatus

Testing apparatus for light emitting diodes

Solar cell testing system, solar cell testing method, and multifunc...

Server system

Light emitting component measuring system and the method thereof

System and method for testing light-emitting devices

Method and system for measuring characteristics of liquid crystal d...

Timing generating apparatus with self-calibrating capability

Patents Applicationslast 30 patents

POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...

POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...

Liquid cooling system, liquid cooling method and electronic device-...

AGING TEST SYSTEM AND AGING TEST METHOD FOR THERMAL INTERFACE MATER...

WAFER INSPECTION METHOD AND INSPECTION APPARATUS

WAFER INSPECTION METHOD AND INSPECTION APPARATUS

Apparatus of Identifying Heterogeneous Time-Series Data Expression...

SOLAR CELL TESTING SYSTEM, SOLAR CELL TESTING METHOD, AND MULTIFUNC...

TESTING APPARATUS FOR LIGHT EMITTING DIODES

OPTICAL MEASUREMENT SYSTEM AND THE DEVICE THEREOF

Light Emitting Component Measuring System and The Method Thereof

Server system

SYSTEM AND METHOD FOR TESTING LIGHT-EMITTING DEVICES

Top mount surface airflow heatsink and top mount heatsink component...

Surface airflow heatsink device and the heatsink device components

Method and system for measuring characteristics of liquid crystal d...