Ian Dudley

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for constructing a profile of a structure in an i...
- Patent number 6,627,887
- Issue date Sep 30, 2003
- Advanced Micro Devices, Inc.
- Ian Dudley
- G01 - MEASURING TESTING
Information Patent Grant
Algorithm for detecting sloped contact holes using a critical-dimen...
- Patent number 6,441,398
- Issue date Aug 27, 2002
- Advanced Micro Devices, Inc.
- Jean Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting sloped contact holes using a critical-dimensio...
- Patent number 6,277,661
- Issue date Aug 21, 2001
- Advanced Micro Devices, Inc.
- Jean Yang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Algorithm for detecting sloped contact holes using a critical-dimen...
- Publication number 20020000550
- Publication date Jan 3, 2002
- Jean Yang
- H01 - BASIC ELECTRIC ELEMENTS