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Ian Jones
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Ottawa, CA
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Patents Grants
last 30 patents
Information
Patent Grant
Ion beam chamber fluid delivery apparatus and method and ion beam e...
Patent number
12,176,177
Issue date
Dec 24, 2024
Techinsights Inc.
Christopher Pawlowicz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for ion beam delayering of a sample and control t...
Patent number
11,214,874
Issue date
Jan 4, 2022
Techinsights Inc.
Robert K. Foster
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for ion beam delayering of a sample and control t...
Patent number
10,689,763
Issue date
Jun 23, 2020
Techinsights Inc.
Robert K. Foster
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method and system for ion beam delayering of a sample and control t...
Patent number
10,550,480
Issue date
Feb 4, 2020
TECHINSIGHTS INC.
Robert K. Foster
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method and system for ion beam delayering of a sample and control t...
Patent number
9,534,299
Issue date
Jan 3, 2017
Techinsights Inc.
Robert K. Foster
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Patents Applications
last 30 patents
Information
Patent Application
ION BEAM CHAMBER FLUID DELIVERY APPARATUS AND METHOD AND ION BEAM E...
Publication number
20220399179
Publication date
Dec 15, 2022
TECHINSIGHTS INC.
Christopher PAWLOWICZ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...
Publication number
20200318242
Publication date
Oct 8, 2020
TECHINSIGHTS INC.
Robert K. Foster
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...
Publication number
20170096741
Publication date
Apr 6, 2017
TECHINSIGHTS INC.
Robert K. Foster
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...
Publication number
20170089813
Publication date
Mar 30, 2017
TECHINSIGHTS INC.
Robert K. Foster
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...
Publication number
20130118896
Publication date
May 16, 2013
Semiconductor Insights Inc.
Robert K. Foster
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...