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Ian MacKenzie
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Cambridge, MA, US
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Patents Grants
last 30 patents
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Patent Grant
High-scan rate positioner for scanned probe microscopy
Patent number
8,860,260
Issue date
Oct 14, 2014
Massachusetts Institute of Technology
David L. Trumper
B82 - NANO-TECHNOLOGY
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Patent Grant
High-scan rate positioner for scanned probe microscopy
Patent number
8,358,039
Issue date
Jan 22, 2013
Massachusetts Institute of Technology
David L. Trumper
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
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Patent Application
HIGH-SCAN RATE POSITIONER FOR SCANNED PROBE MICROSCOPY
Publication number
20130174300
Publication date
Jul 4, 2013
Massachusetts Institute of Technology
David L. Trumper
B82 - NANO-TECHNOLOGY
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Patent Application
HIGH-SCAN RATE POSITIONER FOR SCANNED PROBE MICROSCOPY
Publication number
20100100990
Publication date
Apr 22, 2010
Massachusetts Institute of Technology
David L. Trumper
G01 - MEASURING TESTING