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Ian MacPherson Flanagan
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Minneapolis, MN, US
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last 30 patents
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Patent Grant
Delay-locked loop with built-in self-test of phase margin
Patent number
7,042,971
Issue date
May 9, 2006
LSI Logic Corporation
Ian M. Flanagan
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
System for measuring phase error between two clocks by using a plur...
Patent number
6,636,979
Issue date
Oct 21, 2003
LSI Logic Corporation
Dayanand K. Reddy
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
Phase-locked loop with built-in self-test of phase margin and loop...
Patent number
6,262,634
Issue date
Jul 17, 2001
LSI Logic Corporation
Ian MacPherson Flanagan
H03 - BASIC ELECTRONIC CIRCUITRY