Glenmont, NY, US
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X-Ray Optical Systems, Inc.
Ian Radley
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
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Patent Grant
X-Ray Optical Systems, Inc.
David M. Gibson
G01 - MEASURING TESTING
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Patent Grant
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
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Patent Grant
X-Ray Optical Systems, Inc.
Ian Radley
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
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Patent Grant
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
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Patent Grant
X-Ray Optical Systems, Inc.
Ian Radley
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
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Patent Grant
X-Ray Optical Systems, Inc.
Ian Radley
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent Grant
X-Ray Optical Systems, Inc.
Michael D. Moore
G01 - MEASURING TESTING
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Patent Grant
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
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Patent Grant
X-Ray Optical Systems Incorporated
Ian Radley
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
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Patent Application
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Ian Radley
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Patent Application
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Ian Radley
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
X-Ray Optical Systems, Inc.
Michael D. Moore
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Application
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
David M. Gibson
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
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Patent Application
X-RAY OPTICAL SYSTEMS, INC.
Ian Radley
G01 - MEASURING TESTING
