Ian Richard Barkshire

Follow

Person

Huntingdon Cambs, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle analyser and method using electrostatic filter gri...
- Patent number 8,421,027
- Issue date Apr 16, 2013
- Oxford Instruments Nanotechnology Tools Limited
- Ian Richard Barkshire
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for quantitative analysis of a material
- Patent number 8,222,598
- Issue date Jul 17, 2012
- Oxford Instruments Analytical Limited
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection apparatus
- Patent number 7,151,269
- Issue date Dec 19, 2006
- Oxford Instruments Analytical Ltd.
- Santokh Singh Bhadare
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR QUANTITATIVE ANALYSIS OF A MATERIAL
- Publication number 20110129066
- Publication date Jun 2, 2011
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE ANALYSER AND METHOD
- Publication number 20100163725
- Publication date Jul 1, 2010
- Ian Richard Barkshire
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample inspection apparatus
- Publication number 20060255290
- Publication date Nov 16, 2006
- Oxford Instruments Analytical Limited
- Santokh Singh Bhadare
- H01 - BASIC ELECTRIC ELEMENTS