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Ian S. Dees
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Patents Grants
last 30 patents
Information
Patent Grant
Automatic center frequency and span setting in a test and measureme...
Patent number
9,858,240
Issue date
Jan 2, 2018
Tektronix, Inc.
Ian S. Dees
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of grouping waveforms for a single channel on a single display
Patent number
9,026,945
Issue date
May 5, 2015
Tektronix, Inc.
Ian S. Dees
G01 - MEASURING TESTING
Information
Patent Grant
Automatic generation of frequency domain mask
Patent number
8,199,149
Issue date
Jun 12, 2012
Tektronix, Inc.
Ian S. Dees
G01 - MEASURING TESTING
Information
Patent Grant
Attaching measurement data to an area map
Patent number
7,593,814
Issue date
Sep 22, 2009
Tektronix, Inc.
Ian S. Dees
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATIC CENTER FREQUENCY AND SPAN SETTING IN A TEST AND MEASUREME...
Publication number
20140172339
Publication date
Jun 19, 2014
Tektronix, Inc.
Ian S. Dees
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF GROUPING WAVEFORMS FOR A SINGLE CHANNEL ON A SINGLE DISPLAY
Publication number
20120278763
Publication date
Nov 1, 2012
Tektronix, Inc.
Ian S. Dees
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC GENERATION OF FREQUENCY DOMAIN MASK
Publication number
20090153559
Publication date
Jun 18, 2009
Tektronix, Inc.
Ian S. Dees
G01 - MEASURING TESTING
Information
Patent Application
Attaching measurement data to an area map
Publication number
20070203645
Publication date
Aug 30, 2007
Ian S. Dees
G06 - COMPUTING CALCULATING COUNTING