Ian T. Kohl

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Rio Rancho, NM, US

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Patents Grantslast 30 patents

Information Patent Grant
Scattered light measurement system
- Patent number 9,518,930
- Issue date Dec 13, 2016
- KLA-Tencor Corporation
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspecting a workpiece using scattered light
- Patent number 8,537,350
- Issue date Sep 17, 2013
- KLA-Tencor Corporation
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting a workpiece using polarization of scattered light
- Patent number 8,059,268
- Issue date Nov 15, 2011
- KLA-Tencor Corporation
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting a workpiece surface using polariza...
- Patent number 7,623,227
- Issue date Nov 24, 2009
- KLA-Tencor Corporation
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
System With Polarized Scattered Light
- Publication number 20130342833
- Publication date Dec 26, 2013
- KLA-Tencor Corporation
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Application
Inspecting a Workpiece Using Polarization of Scattered Light
- Publication number 20120013898
- Publication date Jan 19, 2012
- KLA-Tencor Corporation
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspecting a Workpiece Using Polarization of Scattered Light
- Publication number 20100110420
- Publication date May 6, 2010
- KLA-Tencor Corporation
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for inspecting a workpiece surface using polariza...
- Publication number 20060192948
- Publication date Aug 31, 2006
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING