Ibrahim Abdulhalim

Person

Kfar Manda, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and methods for detecting overlay errors using scatterometry
- Patent number 10,451,412
- Issue date Oct 22, 2019
- KLA-Tencor Corporation
- Michael Adel
- G01 - MEASURING TESTING
Information Patent Grant
Periodic patterns and technique to control misalignment between two...
- Patent number 10,151,584
- Issue date Dec 11, 2018
- KLA-Tencor Corporation
- Ibrahim Abdulhalim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Periodic patterns and technique to control misalignment between two...
- Patent number 9,835,447
- Issue date Dec 5, 2017
- KLA-Tencor Corporation
- Ibrahim Abdulhalim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Periodic patterns and technique to control misalignment between two...
- Patent number 9,476,698
- Issue date Oct 25, 2016
- KLA-Tencor Corporation
- Ibrahim Abdulhalim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Periodic patterns and techniques to control misalignment between tw...
- Patent number 9,234,745
- Issue date Jan 12, 2016
- KLA-Tencor Corporation
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Grant
Periodic patterns and technique to control misalignment between two...
- Patent number 9,103,662
- Issue date Aug 11, 2015
- KLA-Tencor Corporation
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Grant
Periodic patterns and technique to control misalignment between two...
- Patent number 8,570,515
- Issue date Oct 29, 2013
- KLA-Tencor Corporation
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Grant
Periodic patterns and technique to control misaligment between two...
- Patent number 8,525,994
- Issue date Sep 3, 2013
- KLA-Tencor Corporation
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a critical dimension and overla...
- Patent number 8,502,979
- Issue date Aug 6, 2013
- KLA-Tencor Technologies Corp.
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a critical dimension and overla...
- Patent number 8,179,530
- Issue date May 15, 2012
- KLA-Tencor Technologies Corp.
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a critical dimension and overla...
- Patent number 7,751,046
- Issue date Jul 6, 2010
- KLA-Tencor Technologies Corp.
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Grant
Periodic patterns and technique to control misalignment between two...
- Patent number 7,656,528
- Issue date Feb 2, 2010
- KLA-Tencor Corporation
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic scatterometer system
- Patent number 7,173,699
- Issue date Feb 6, 2007
- KLA-Tencor Technologies Corporation
- Yiping Xu
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic scatterometer system
- Patent number 6,590,656
- Issue date Jul 8, 2003
- KLA-Tencor Corporation
- Yiping Xu
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic scatterometer system
- Patent number 6,483,580
- Issue date Nov 19, 2002
- KLA-Tencor Technologies Corporation
- Yiping Xu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PERIODIC PATTERNS AND TECHNIQUE TO CONTROL MISALIGNMENT BETWEEN TWO...
- Publication number 20180100735
- Publication date Apr 12, 2018
- KLA-Tencor Corporation
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Application
PERIODIC PATTERNS AND TECHNIQUE TO CONTROL MISALIGNMENT BETWEEN TWO...
- Publication number 20170038198
- Publication date Feb 9, 2017
- KLA-Tencor Corporation
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Application
Periodic Patterns and Technique to Control Misalignment Between Two...
- Publication number 20160084639
- Publication date Mar 24, 2016
- KLA-Tencor Corporation
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Application
Periodic Patterns and Technique to Control Misalignment Between Two...
- Publication number 20140022563
- Publication date Jan 23, 2014
- KLA-Tencor Corporation
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Determining a Critical Dimension and Overla...
- Publication number 20130314710
- Publication date Nov 28, 2013
- KLA-Tencor Technologies Corporation
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLA...
- Publication number 20130039460
- Publication date Feb 14, 2013
- KLA-Tencor Technologies Corporation
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLA...
- Publication number 20100271621
- Publication date Oct 28, 2010
- KLA-Tencor Technologies Corporation
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Application
PERIODIC PATTERNS AND TECHNIQUE TO CONTROL MISALIGNMENT BETWEEN TWO...
- Publication number 20100073688
- Publication date Mar 25, 2010
- KLA-Tencor Technologies Corporation
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Application
PERIODIC PATTERNS AND TECHNIQUE TO CONTROL MISALIGMENT BETWEEN TWO...
- Publication number 20090231584
- Publication date Sep 17, 2009
- KLA-Tencor Technology Corporation
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Application
Periodic Patterns and Technique to Control Misalignment Between Two...
- Publication number 20070127025
- Publication date Jun 7, 2007
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic Scatterometer System
- Publication number 20070091327
- Publication date Apr 26, 2007
- Yiping Xu
- G01 - MEASURING TESTING
Information Patent Application
Periodic patterns and technique to control misalignment between two...
- Publication number 20060262326
- Publication date Nov 23, 2006
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Application
Periodic patterns and technique to control misalignment between two...
- Publication number 20060132807
- Publication date Jun 22, 2006
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Application
Periodic patterns and technique to control misalignment between two...
- Publication number 20060065625
- Publication date Mar 30, 2006
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Application
Periodic patterns and technique to control misalignment
- Publication number 20050208685
- Publication date Sep 22, 2005
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Application
Periodic patterns and technique to control misalignment between two...
- Publication number 20050157297
- Publication date Jul 21, 2005
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Application
Periodic patterns and technique to control misalignment between two...
- Publication number 20040229471
- Publication date Nov 18, 2004
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Application
Periodic patterns and technique to control misalignment between two...
- Publication number 20040061857
- Publication date Apr 1, 2004
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for lithography process control
- Publication number 20040005507
- Publication date Jan 8, 2004
- KLA-Tencor, Inc.
- Suresh Lakkapragada
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic scatterometer system
- Publication number 20030058443
- Publication date Mar 27, 2003
- Yiping Xu
- G01 - MEASURING TESTING
Information Patent Application
Periodic patterns and technique to control misalignment
- Publication number 20030002043
- Publication date Jan 2, 2003
- KLA-Tencor Corporation
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING

Ibrahim Abdulhalim

Person

Patents Grantslast 30 patents

Apparatus and methods for detecting overlay errors using scatterometry

Periodic patterns and technique to control misalignment between two...

Periodic patterns and technique to control misalignment between two...

Periodic patterns and technique to control misalignment between two...

Periodic patterns and techniques to control misalignment between tw...

Periodic patterns and technique to control misalignment between two...

Periodic patterns and technique to control misalignment between two...

Periodic patterns and technique to control misaligment between two...

Methods and systems for determining a critical dimension and overla...

Methods and systems for determining a critical dimension and overla...

Methods and systems for determining a critical dimension and overla...

Periodic patterns and technique to control misalignment between two...

Spectroscopic scatterometer system

Spectroscopic scatterometer system

Spectroscopic scatterometer system

Patents Applicationslast 30 patents

PERIODIC PATTERNS AND TECHNIQUE TO CONTROL MISALIGNMENT BETWEEN TWO...

PERIODIC PATTERNS AND TECHNIQUE TO CONTROL MISALIGNMENT BETWEEN TWO...

Periodic Patterns and Technique to Control Misalignment Between Two...

Periodic Patterns and Technique to Control Misalignment Between Two...

Methods and Systems for Determining a Critical Dimension and Overla...

METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLA...

METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLA...

PERIODIC PATTERNS AND TECHNIQUE TO CONTROL MISALIGNMENT BETWEEN TWO...

PERIODIC PATTERNS AND TECHNIQUE TO CONTROL MISALIGMENT BETWEEN TWO...

Periodic Patterns and Technique to Control Misalignment Between Two...

Spectroscopic Scatterometer System

Periodic patterns and technique to control misalignment between two...

Periodic patterns and technique to control misalignment between two...

Periodic patterns and technique to control misalignment between two...

Periodic patterns and technique to control misalignment

Periodic patterns and technique to control misalignment between two...

Periodic patterns and technique to control misalignment between two...

Periodic patterns and technique to control misalignment between two...

Methods and systems for lithography process control

Spectroscopic scatterometer system

Periodic patterns and technique to control misalignment