IBRAHIM ABDULHALM

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Kfar Manda, IL

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Patents Grantslast 30 patents

Information Patent Grant
Spectroscopic scatterometer system
- Patent number 7,898,661
- Issue date Mar 1, 2011
- KLA-Tencor Corporation
- Yiping Xu
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic scatterometer system
- Patent number 7,859,659
- Issue date Dec 28, 2010
- KLA-Tencor Corporation
- Yiping Xu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Spectroscopic Scatterometer System
- Publication number 20110125458
- Publication date May 26, 2011
- KLA-Tencor Corporation
- YIPING XU
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC SCATTEROMETER SYSTEM
- Publication number 20100165340
- Publication date Jul 1, 2010
- KLA-Tencor Technologies Corporation
- Yiping Xu
- G01 - MEASURING TESTING