Ichiro Ishimaru

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Mure, JP

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Patents Grantslast 30 patents

Information Patent Grant
Surface inspection apparatus and method thereof
- Patent number 9,551,670
- Issue date Jan 24, 2017
- Hitachi, Ltd.
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus and method thereof
- Patent number 8,729,514
- Issue date May 20, 2014
- Hitachi High-Technologies Corporaation
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus and method thereof
- Patent number 7,952,085
- Issue date May 31, 2011
- Hitachi, Ltd.
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus and method thereof
- Patent number 7,417,244
- Issue date Aug 26, 2008
- Hitachi, Ltd.
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus and method thereof
- Patent number 7,242,016
- Issue date Jul 10, 2007
- Hitachi, Ltd.
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus and method thereof
- Patent number 6,894,302
- Issue date May 17, 2005
- Hitachi, Ltd.
- Ichiro Ishimaru
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SURFACE INSPECTION APPARATUS AND METHOD THEREOF
- Publication number 20140218723
- Publication date Aug 7, 2014
- Hitachi High-Technologies Corporation
- Ichiro ISHIMARU
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS AND METHOD THEREOF
- Publication number 20120069329
- Publication date Mar 22, 2012
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS AND METHOD THEREOF
- Publication number 20090103078
- Publication date Apr 23, 2009
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus and method thereof
- Publication number 20070121108
- Publication date May 31, 2007
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus and method thereof
- Publication number 20050185172
- Publication date Aug 25, 2005
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus and method thereof
- Publication number 20010030296
- Publication date Oct 18, 2001
- Ichiro Ishimaru
- G01 - MEASURING TESTING