Ichiro Midorikawa

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Contactor having conductive particles in a hole as a contact electrode
- Patent number 7,202,679
- Issue date Apr 10, 2007
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Contactor having conductive particles in a hole as a contact electrode
- Patent number 7,038,477
- Issue date May 2, 2006
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Contactor having conductive particles in a hole as a contact electrode
- Patent number 6,937,038
- Issue date Aug 30, 2005
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Contactor having conductive particles in a hole as a contact electrode
- Patent number 6,545,363
- Issue date Apr 8, 2003
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing a logic circuit using parallel to...
- Patent number 4,553,090
- Issue date Nov 12, 1985
- Fujitsu Limited
- Yoshinori Hatano
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Contactor having conductive particles in a hole as a contact electrode
- Publication number 20060119374
- Publication date Jun 8, 2006
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Contactor having conductive particles in a hole as a contact electrode
- Publication number 20050110509
- Publication date May 26, 2005
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Contactor having conductive particles in a hole as a contact electrode
- Publication number 20030141884
- Publication date Jul 31, 2003
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Contactor having conductive particles in a hole as a contact electrode
- Publication number 20020013010
- Publication date Jan 31, 2002
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING