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Ichiro TACHIBANA
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Hitachinaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Charged particle beam device
Patent number
10,971,328
Issue date
Apr 6, 2021
HITACHI HIGH-TECH CORPORATION
Takanori Kishimoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device
Patent number
10,734,191
Issue date
Aug 4, 2020
HITACHI HIGH-TECH CORPORATION
Takanori Kishimoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device
Patent number
9,324,540
Issue date
Apr 26, 2016
Hitachi High-Technologies Corporation
Ichiro Tachibana
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle radiation device
Patent number
8,729,467
Issue date
May 20, 2014
Hitachi High-Technologies Corporation
Hiroshi Tsuji
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Charged particle radiation device
Patent number
8,629,410
Issue date
Jan 14, 2014
Hitachi High-Technologies Corporation
Hiroshi Tsuji
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Electron beam apparatus and electron beam inspection method
Patent number
8,431,893
Issue date
Apr 30, 2013
Hitachi High-Technologies Corporation
Muneyuki Fukuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope and method of imaging an object by usi...
Patent number
8,222,601
Issue date
Jul 17, 2012
Hitachi High-Technologies Corporation
Ichiro Tachibana
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam apparatus and electron beam inspection method
Patent number
8,207,498
Issue date
Jun 26, 2012
Hitachi High-Technologies Corporation
Muneyuki Fukuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope and method of imaging an object by usi...
Patent number
7,888,640
Issue date
Feb 15, 2011
Hitachi High-Technologies Corporation
Ichiro Tachibana
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam apparatus and electron beam inspection method
Patent number
7,875,849
Issue date
Jan 25, 2011
Hitachi High-Technologies Corporation
Muneyuki Fukuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope
Patent number
7,619,219
Issue date
Nov 17, 2009
Hitachi High-Technologies Corporation
Naomasa Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope and apparatus for detecting defect
Patent number
7,504,626
Issue date
Mar 17, 2009
Hitachi High-Technologies Corporation
Ichiro Tachibana
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Charged Particle Beam Apparatus
Publication number
20230170182
Publication date
Jun 1, 2023
Hitachi High-Tech Corporation
Kazufumi YACHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device
Publication number
20200312606
Publication date
Oct 1, 2020
HITACHI HIGH-TECH CORPORATION
Takanori KISHIMOTO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device
Publication number
20180204706
Publication date
Jul 19, 2018
Hitachi High-Technologies Corporation
Takanori KISHIMOTO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device
Publication number
20150136979
Publication date
May 21, 2015
Hitachi High-Technologies Corporation
Ichiro Tachibana
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron Beam Apparatus and Electron Beam Inspection Method
Publication number
20120261574
Publication date
Oct 18, 2012
Muneyuki Fukuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE RADIATION DEVICE
Publication number
20120193550
Publication date
Aug 2, 2012
Hitachi High-Technologies Corporation
Hiroshi Tsuji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE RADIATION DEVICE
Publication number
20120091362
Publication date
Apr 19, 2012
Hitachi High-Technologies Corporation
Hiroshi Tsuji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron Beam Apparatus And Electron Beam Inspection Method
Publication number
20110101223
Publication date
May 5, 2011
Muneyuki Fukuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNING ELECTRON MICROSCOPE AND METHOD OF IMAGING AN OBJECT BY USI...
Publication number
20110095184
Publication date
Apr 28, 2011
Hitachi High-Technologies Corporation
Ichiro TACHIBANA
G01 - MEASURING TESTING
Information
Patent Application
SCANNING ELECTRON MICROSCOPE AND METHOD OF IMAGING AN OBJECT BY USI...
Publication number
20080310704
Publication date
Dec 18, 2008
Hitachi High-Technologies Corporation
Ichiro TACHIBANA
G01 - MEASURING TESTING
Information
Patent Application
Scanning Electron Microscope
Publication number
20080135755
Publication date
Jun 12, 2008
Hitachi High-Technologies Corporation
Naomasa SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron Beam Apparatus and Electron Beam Inspection Method
Publication number
20080099673
Publication date
May 1, 2008
Muneyuki Fukuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning electron microscope and apparatus for detecting defect
Publication number
20070187598
Publication date
Aug 16, 2007
Ichiro Tachibana
H01 - BASIC ELECTRIC ELEMENTS