Ichiro Tobita

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Inagi-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical axis adjustment device for X-ray analyzer
- Patent number 9,562,867
- Issue date Feb 7, 2017
- Rigaku Corporation
- Kouji Kakefuda
- G01 - MEASURING TESTING
Information Patent Grant
Optical axis adjustment method for X-ray analyzer and X-ray analyzer
- Patent number 9,442,084
- Issue date Sep 13, 2016
- Rigaku Corporation
- Kouji Kakefuda
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction apparatus
- Patent number 8,903,044
- Issue date Dec 2, 2014
- Rigaku Corporation
- Sigematsu Asano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL AXIS ADJUSTMENT DEVICE FOR X-RAY ANALYZER
- Publication number 20150146860
- Publication date May 28, 2015
- Rigaku Corporation
- Kouji KAKEFUDA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL AXIS ADJUSTMENT METHOD FOR X-RAY ANALYZER AND X-RAY ANALYZER
- Publication number 20150146859
- Publication date May 28, 2015
- Rigaku Corporation
- Kouji KAKEFUDA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION APPARATUS
- Publication number 20120195406
- Publication date Aug 2, 2012
- Rigaku Corporation
- Sigematsu Asano
- G01 - MEASURING TESTING