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Ido Adam
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Qiriat Ono, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Accuracy improvements in optical metrology
Patent number
11,862,522
Issue date
Jan 2, 2024
Barak Bringoltz
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Overlay measurement using multiple wavelengths
Patent number
11,158,548
Issue date
Oct 26, 2021
KLA-Tencor Corporation
Yuval Lamhot
G01 - MEASURING TESTING
Information
Patent Grant
Mitigation of inaccuracies related to grating asymmetries in scatte...
Patent number
11,112,704
Issue date
Sep 7, 2021
KLA-Tencor Corporation
Ido Adam
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of analyzing and utilizing landscapes to reduce or eliminate...
Patent number
10,831,108
Issue date
Nov 10, 2020
KLA Corporation
Tal Marciano
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
ACCURACY IMPROVEMENTS IN OPTICAL METROLOGY
Publication number
20210175132
Publication date
Jun 10, 2021
KLA-Tencor Corporation
Barak Bringoltz
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OVERLAY MEASUREMENT USING MULTIPLE WAVELENGTHS
Publication number
20200381312
Publication date
Dec 3, 2020
KLA-Tencor Corporation
Yuval Lamhot
G01 - MEASURING TESTING
Information
Patent Application
Mitigation of Inaccuracies Related to Grating Asymmetries in Scatte...
Publication number
20190033726
Publication date
Jan 31, 2019
KLA-Tencor Corporation
Ido Adam
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
ACCURACY IMPROVEMENTS IN OPTICAL METROLOGY
Publication number
20180047646
Publication date
Feb 15, 2018
KLA-Tencor Corporation
Barak Bringoltz
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS OF ANALYZING AND UTILIZING LANDSCAPES TO REDUCE OR ELIMINAT...
Publication number
20160313658
Publication date
Oct 27, 2016
KLA-Tencor Corporation
Tal Marciano
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY