Ido Dolev

Person

Manof, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of measuring misregistration of semiconductor devices
- Patent number 11,226,566
- Issue date Jan 18, 2022
- KLA-Tencor Corporation
- Roie Volkovich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computerized method for configuring an inspection system, computer...
- Patent number 11,029,253
- Issue date Jun 8, 2021
- Applied Materials Israel Ltd.
- Amir Shoham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring misregistration of semiconductor devices
- Patent number 10,928,739
- Issue date Feb 23, 2021
- KLA-Tencor Corporation
- Roie Volkovich
- G01 - MEASURING TESTING
Information Patent Grant
Asymmetrical magnification inspection system and illumination module
- Patent number 10,481,101
- Issue date Nov 19, 2019
- Applied Materials Israel Ltd.
- Haim Feldman
- G02 - OPTICS
Information Patent Grant
Inspection system and a method for evaluating an exit pupil of an i...
- Patent number 9,846,128
- Issue date Dec 19, 2017
- Applied Materials Israel Ltd.
- Harel Ilan
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for inspecting an object
- Patent number 9,535,014
- Issue date Jan 3, 2017
- Applied Materials Israel Ltd.
- Haim Feldman
- G02 - OPTICS
Information Patent Grant
Inspection having a segmented pupil
- Patent number 9,354,212
- Issue date May 31, 2016
- Applied Materials Israel Ltd.
- Yoav Berlatzky
- G01 - MEASURING TESTING
Information Patent Grant
Mapping variations of a surface
- Patent number 8,724,882
- Issue date May 13, 2014
- Applied Materials Israel, Ltd.
- Doron Meshulach
- G01 - MEASURING TESTING
Information Patent Grant
Scanning microscopy using inhomogeneous polarization
- Patent number 8,228,601
- Issue date Jul 24, 2012
- Applied Materials Israel, Ltd.
- Doron Meshulach
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR ROTATIONAL CALIBRATION OF METROLOGY TOOLS
- Publication number 20230068016
- Publication date Mar 2, 2023
- KLA Corporation
- Alexander Novikov
- G01 - MEASURING TESTING
Information Patent Application
ON-PRODUCT OVERLAY TARGETS
- Publication number 20220328365
- Publication date Oct 13, 2022
- KLA Corporation
- Amnon Manassen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MEASURING MISREGISTRATION OF SEMICONDUCTOR DEVICES
- Publication number 20210149314
- Publication date May 20, 2021
- KLA-Tencor Corporation
- Roie VOLKOVICH
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING MISREGISTRATION OF SEMICONDUCTOR DEVICES
- Publication number 20200271596
- Publication date Aug 27, 2020
- KLA-Tencor Corporation
- Roie VOLKOVICH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPUTERIZED METHOD FOR CONFIGURING AN INSPECTION SYSTEM, COMPUTER...
- Publication number 20180284031
- Publication date Oct 4, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Amir Shoham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ASYMMETRICAL MAGNIFICATION INSPECTION SYSTEM AND ILLUMINATION MODULE
- Publication number 20180209915
- Publication date Jul 26, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Haim Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection System and a Method for Evaluating an Exit Pupil of an I...
- Publication number 20170205359
- Publication date Jul 20, 2017
- APPLIED MATERIALS ISRAEL, LTD.
- Harel Ilan
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING AN OBJECT
- Publication number 20170016834
- Publication date Jan 19, 2017
- APPLIED MATERIALS ISRAEL, LTD.
- Haim Feldman
- G02 - OPTICS
Information Patent Application
INSPECTION HAVING A SEGMENTED PUPIL
- Publication number 20150193926
- Publication date Jul 9, 2015
- APPLIED MATERIALS ISRAEL, LTD.
- Yoav Berlatzky
- G01 - MEASURING TESTING
Information Patent Application
MAPPING VARIATIONS OF A SURFACE
- Publication number 20110158502
- Publication date Jun 30, 2011
- Doron Meshulach
- G01 - MEASURING TESTING
Information Patent Application
SCANNING MICROSCOPY USING INHOMOGENEOUS POLARIZATION
- Publication number 20090284835
- Publication date Nov 19, 2009
- Doron Meshulach
- G02 - OPTICS

Person

Patents Grantslast 30 patents

Method of measuring misregistration of semiconductor devices

Computerized method for configuring an inspection system, computer...

Method of measuring misregistration of semiconductor devices

Asymmetrical magnification inspection system and illumination module

Inspection system and a method for evaluating an exit pupil of an i...

Systems and methods for inspecting an object

Inspection having a segmented pupil

Mapping variations of a surface

Scanning microscopy using inhomogeneous polarization

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR ROTATIONAL CALIBRATION OF METROLOGY TOOLS

ON-PRODUCT OVERLAY TARGETS

METHOD OF MEASURING MISREGISTRATION OF SEMICONDUCTOR DEVICES

METHOD OF MEASURING MISREGISTRATION OF SEMICONDUCTOR DEVICES

COMPUTERIZED METHOD FOR CONFIGURING AN INSPECTION SYSTEM, COMPUTER...

ASYMMETRICAL MAGNIFICATION INSPECTION SYSTEM AND ILLUMINATION MODULE

Inspection System and a Method for Evaluating an Exit Pupil of an I...

SYSTEMS AND METHODS FOR INSPECTING AN OBJECT

INSPECTION HAVING A SEGMENTED PUPIL

MAPPING VARIATIONS OF A SURFACE

SCANNING MICROSCOPY USING INHOMOGENEOUS POLARIZATION