Ido Dolev

Follow

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Overlay metrology using spectroscopic phase
- Patent number 11,713,959
- Issue date Aug 1, 2023
- KLA Corporation
- Andrei V. Shchegrov
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MASSIVE MEASUREMENT SAMPLING USING MULTIPLE CHUCKS AND OPTICAL COLUMNS
- Publication number 20250138435
- Publication date May 1, 2025
- KLA Corporation
- Jonathan Madsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SPECTRAL ANGULAR METROLOGY
- Publication number 20250076208
- Publication date Mar 6, 2025
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL SCANNING OVERLAY METROLOGY WITH OPTICAL META-SURFACES
- Publication number 20240337606
- Publication date Oct 10, 2024
- KLA Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Application
OVERLAY METROLOGY USING SPECTROSCOPIC PHASE
- Publication number 20220299308
- Publication date Sep 22, 2022
- Andrei V. Shchegrov
- G01 - MEASURING TESTING