Ido Kofler

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Givataim, IL

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Patents Grantslast 30 patents

Information Patent Grant
Inspection system and a method for evaluating an exit pupil of an i...
- Patent number 9,846,128
- Issue date Dec 19, 2017
- Applied Materials Israel Ltd.
- Harel Ilan
- G01 - MEASURING TESTING
Information Patent Grant
Optical element for spatial beam shaping
- Patent number 9,664,907
- Issue date May 30, 2017
- Applied Materials Israel Ltd.
- Yoav Berlatzky
- G02 - OPTICS
Information Patent Grant
Optical system and method for inspection of patterned samples
- Patent number 8,614,790
- Issue date Dec 24, 2013
- Applied Materials Israel, Ltd.
- Yoav Berlatzky
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTIMIZATION OF THE RECIPE OF AN EXAMINATION TOOL
- Publication number 20240221146
- Publication date Jul 4, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yigal KOTLER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection System and a Method for Evaluating an Exit Pupil of an I...
- Publication number 20170205359
- Publication date Jul 20, 2017
- APPLIED MATERIALS ISRAEL, LTD.
- Harel Ilan
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ELEMENT FOR SPATIAL BEAM SHAPING
- Publication number 20160018660
- Publication date Jan 21, 2016
- APPLIED MATERIALS ISRAEL, LTD.
- Yoav Berlatzky
- G02 - OPTICS
Information Patent Application
OPTICAL SYSTEM AND METHOD FOR INSPECTION OF PATTERNED SAMPLES
- Publication number 20130148114
- Publication date Jun 13, 2013
- Yoav Berlatzky
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM AND METHOD FOR INSPECTION OF PATTERNED SAMPLES
- Publication number 20130148115
- Publication date Jun 13, 2013
- Yoav Berlatzky
- G01 - MEASURING TESTING